SCAN928028 - 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST
Datasheet Packaging Samples & Pricing Reliability Design Tools Models Knowledge Base

Features
IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test mode.
All 8 channels synchronous to one parallel clock rate, from 18 to 66 MHz
Duplicates function of multiple DS92LV1021 and '1023 10-bit Serializer devices
Serializes from one to eight 10-bit parallel inputs into data streams with embedded clock
Eight 5 mA modified Bus LVDS outputs that are capable to drive double terminations
@Speed Test - PRBS generation to check LVDS transmission path to SCAN921224, SCAN921226, SCAN921260, or SCAN926260
On chip filtering for PLL
740mW typ power dissipation (loaded, PRBS, 66MHz, 3.3V)
High impedance inputs and outputs on power off
Single power supply at +3.3V (+/-10%)
196-pin LBGA package
Industrial temperature range operation: -40 to +85°C

General Description


The SCAN928028 integrates eight serializer devices into a single chip. More...


  Typical Application
*click for larger image


ParametersValues
Function Serializer
Total Throughput 5280 Mbps
Payload/Channel 660 Mbps
Clock Min 25 MHz
Clock Max 66 MHz
Input Compatibility LVTTL
Output Compatibility LVDS/BLVDS
Start/Stop Bit Yes
Power Consumption_ 868 mW
SupplyVoltage 3.3 Volt
Eval Kit BLVDS03
ESD 1.5 kV
Temperature Min -40 deg C
Temperature Max 85 deg C
Compression Ratio 10:1
Parallel Bus Width 10 bits
Number Transmitters 8
JTAG1149.1 Yes
Communications Yes
Sensing & Imaging Yes


Typical Performance


*click for larger image


  Additional Resources
Online Seminars Design Tools


Block Diagram


*click for larger image



Datasheet
RoHS Compliance Information Size in KbytesDate Click link below to Download
SCAN928028 8 Channel 10:1 Serializer with IEEE 1149.1 and At-Speed BIST 399
Kbytes
2-May-08 Download

If you have trouble printing or viewing PDF file(s), see Printing Problems.


Package Availability, Models, Samples & Pricing
Part NumberPackageFactory Lead TimeModelsSamples &
Electronic
Orders
Budgetary PricingStd
Pack
Size
Package
Marking
Format
TypePinsSpec.MSL
Rating
Peak
Reflow
RoHS
Report
CAD
Symbols
WeeksQtyQty$US each
BLVDS0310-Bit Bus LVDS Serializer / Deserializer Evaluation BoardPreliminaryN/A
 
Buy Now
1+$299.001-
N/AN/A
SCAN928028TUFLBGA196NOPB
STD
3
3
260
220
RoHS Download Full production
scan928028tuf.ibs
Samples
Buy Now
1K+$22.00tray
of
119
NSUZXYYTTE#
SCAN928028T
UF
BBBBB
12 weeks100
SCAN928028TUFXLBGA196NOPB
STD
3
3
260
220
RoHS Download Full production
scan928028tuf.ibs
 
Buy Now
1K+$22.00reel
of
1000
NSUZXYYTTE#
SCAN928028T
UF
BBBBB
16 weeks2000

General Description


The SCAN928028 integrates eight serializer devices into a single chip. The SCAN928028 can simultaneously serialize up to eight 10-bit data streams. The 10-bit parallel inputs are LVTTL signal levels. The serialized outputs are LVDS signals with extra drive current for point-to-point and lightly loaded multidrop applications. Each serializer block in the SCAN928028 operates independently by using strobes from a single shared PLL.

The SCAN928028 uses a single +3.3V power supply with a typical power dissipation of 740mW (3.3V / PRBS / 66 MHz). Each serializer channel has a unique power down control to further conserve power consumption.

For high-speed LVDS serial data transmission, line quality is essential, thus the SCAN928028 includes an @SPEED TEST function. Each Serializer channel has the ability to internally generate a PRBS data pattern. This pattern is received by specific deserializers (SCAN921224) which have the complement PRBS verification circuit. The deserializer checks the data pattern for bit errors and reports any errors on the test verification pins on the deserializer.

For additional information - please see the Applications Information section in this datasheet.

Reliability Metrics


Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
SCAN928028TUFCMOS811314055016155003458102536
SCAN928028TUFXCMOS811314055016155003458102536

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


Design Tools


TitleSize in Kbytes Date Click link below to Download    
8B/10-Bit Bus LVDS Serializer / Deserializer Evaluation Board     View    

If you have trouble printing or viewing PDF file(s), see Printing Problems.

[Information as of 8-Nov-2009]