Features High Temperature Operation to 125°C IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test mode. Clock recovery from PLL lock to random data patterns. Guaranteed transition every data transfer cycle Chipset (Tx + Rx) power consumption < 600 mW (typ) @ 80 MHz Single differential pair eliminates multi-channel skew 800 Mbps serial Bus LVDS data rate (at 80 MHz clock) 10-bit parallel interface for 1 byte data plus 2 control bits Synchronization mode and LOCK indicator Programmable edge trigger on clock High impedance on receiver inputs when power is off Bus LVDS serial output rated for 27 load Small 49-lead BGA package Description The SCAN921025H transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921226H receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard for Boundary Scan Test. IEEE 1149.1 features provide the design or test engineer access via a standard Test Access Port (TAP) to the backplane or cable interconnects and the ability to verify differential signal integrity. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed. The SCAN921025H transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-to-data and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock guarantees a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921025H output pins into TRI-STATE to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 80 MHz. Applications Automotive Industrial Military/Aerospace

Also Recommended SCAN921025H▲ 10-Bit Serializer For Complete Chipset

	Block Diagram click for larger image

Datasheets

Title		Size	Date	Other Language
	SCAN921226H High Temperature 20MHz - 80MHz 10-Bit Deserializer with IEEE 1149.1 Test Access	908 Kbytes	8-Dec-05

Application Notes

Title		Size	Date	Other Language
	AN-1909: Application Note 1909 DS15BA101 and DS15EA101 Enable Long Reach Applications for Embedded Clock SER/DES	360 Kbytes	2-Mar-09	中文

Part Number(s) (NSID)	Top View	Availability	Current Reported Stock	Budgetary Pricing	Pack Size
SCAN921226HSM/NOPB SCAN921226HSM RoHS Status	FBGA	Full production Lead Time: 6 weeks	Distributor Region Qty AVNET-EM Worldwide 447 DIGI-KEY Worldwide 584	$4.50 each at 1K+ pcs	tray of 416
SCAN921226HSMX RoHS Status	FBGA	Full production Lead Time: 16 weeks	Distributor Region Qty DIGI-KEY Worldwide 0	$4.50 each at 1K+ pcs	reel of 2000

All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for SCAN921226H.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for SCAN921226H is located at RoHS Status.

Part Number(s) (NSID)	Weight (milligrams)	Type	Pins	MSL Rating	Peak Reflow	RoHS Status	CAD Symbols	Models	Package Marking Format
SCAN921226HSM/NOPB SCAN921226HSM	120.419 122.75	FBGA	49	4 3	260 235	Detail	Download	ibis file	NSUZXYTTE# SCAN921226 HSM
SCAN921226HSMX	122.75	FBGA	49	3	235	Detail	Download	N/A	NSUZXYTTE# SCAN921226 HSM

All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for SCAN921226H.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for SCAN921226H is located at RoHS Status.

CAD Symbols and Models Download SCAN921226H CAD Symbols

Models ibis file

Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
SCAN921226HSM	CMOS8	1	13725	73	0	1774500	2	503519220
SCAN921226HSMX	CMOS8	1	13725	73	0	1774500	2	503519220

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.

All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for SCAN921226H.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for SCAN921226H is located at RoHS Status.