Datasheet
Package Availability, Models, Samples & Pricing
General Description
The SCAN90CP02 is a 1.5 Gbps 2 x 2 LVDS crosspoint switch. High speed data paths and flow-through pinout minimize internal
device jitter, while configurable 0/25/50/100% pre-emphasis overcomes external ISI jitter effects of lossy backplanes and
cables. The differential inputs interface to LVDS and Bus LVDS signals such as those on National's 10-, 16-, and 18- bit Bus
LVDS SerDes, as well as CML and LVPECL. The SCAN90CP02 can also be used with ASICs and FPGAs. The non-blocking crosspoint
architecture is pin-configurable as a 1:2 clock or data splitter, 2:1 redundancy mux, crossover function, or dual buffer for
signal booster and stub hider applications.
Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry supports testability of both single-ended LVTTL/CMOS and differential LVDS
PCB interconnect. The 3.3V supply, CMOS process, and LVDS I/O ensure high performance at low power over the entire industrial
-40 to +85°C temperature range.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
SCAN90CP02SP | CMOS8 | 1 | 13140 | 55 | 0 | 1615500 | 3 | 458102536
|
|
SCAN90CP02SPX | CMOS8 | 1 | 13140 | 55 | 0 | 1615500 | 3 | 458102536
|
|
SCAN90CP02VY | CMOS8 | 1 | 13140 | 55 | 0 | 1615500 | 3 | 458102536
|
|
SCAN90CP02VYX | CMOS8 | 1 | 13140 | 55 | 0 | 1615500 | 3 | 458102536
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Application Notes
| Title | Size in Kbytes |
Date |
 |
| AN-1313: Application Note 1313 SCAN90CP02 Design for Test Features |
428 Kbytes |
11-Mar-05 |
Download |
AN-1313 (Chinese): Application Note 1313 SCAN90CP02 Design for Test Features
|
259 Kbytes |
|
 |
[Information as of 7-Nov-2009]
|