Features • 1.5 Gbps maximum data rate per channel • Configurable pre-emphasis drives lossy backplanes and cables • Low output skew and jitter • LVDS/CML/LVPECL compatible input, LVDS output • On-chip 100Ω input and output termination • 12 kV ESD protection on LVDS Outputs • IEEE 1149.1 and 1149.6 compliant • Fault Insertion • Single 3.3V supply • Very low power consumption • Industrial -40 to +85°C temperature range • Small TQFP Package Footprint • Evaluation Kit Available • See DS90LV004 for non-JTAG version Description The SCAN90004 is a four channel 1.5 Gbps LVDS buffer/repeater. High speed data paths and flow-through pinout minimize internal device jitter and simplify board layout, while configurable pre-emphasis overcomes ISI jitter effects from lossy backplanes and cables. The differential inputs interface to LVDS, and Bus LVDS signals such as those on National's 10-, 16-, and 18- bit Bus LVDS SerDes, as well as CML and LVPECL. The differential inputs and outputs are internally terminated with a 100Ω resistor to improve performance and minimize board space. The repeater function is especially useful for boosting signals for longer distance transmission over lossy cables and backplanes. Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry supports testability of both single-ended LVTTL/CMOS and high-speed differential LVDS interconnects. The 3.3V supply, CMOS process, and LVDS I/O ensure stable high performance at low power over the entire industrial -40 to +85°C temperature range.

Also Recommended DS15BR400▲ 2.0 Gbps Low Jitter LVDS Quad DS90LV004▲ For Version Without IEEE 1149.1 (JTAG) MY BRIEFCASE                                       Click any "Briefcase" icon to add an item

Typical Application *click for larger image	Block Diagram *click for larger image
Typical Performance *click for larger image

Datasheet

Title		Size	Date	Other Language
	SCAN90004 4-Channel LVDS Buffer/Repeater with Pre-Emphasis and IEEE 1149.6	287 Kbytes	17-Oct-08

Featured Application Notes

Title		Size	Date	Other Language
	AN-1328: Application Note 1328 Using Built-In Self-Tests (BIST) with SCAN50C400	1350 Kbytes	7-Oct-04
	AN-1380: Application Note 1380 Design Challenges in 5 Gbps Copper Backplanes	2814 Kbytes	25-Apr-05	日本語

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Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
SCAN90004TVS	CMOS8	1	13140	55	0	1615500	3	458102536

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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