Features • 1.5 Gbps data rate per channel • Configurable off/on pre-emphasis drives lossy backplanes and cables • LVDS/BLVDS/CML/LVPECL compatible inputs, LVDS compatible outputs • Low output skew and jitter • On-chip 100 input and output termination • IEEE 1149.1 and 1149.6 compliant • 15 kV ESD protection on LVDS inputs/outputs • Hot plug Protection • Single 3.3V supply • Industrial -40 to +85°C temperature range • 48-pin LLP Package Description The SCAN15MB200 is a dual-port 2 to 1 multiplexer and 1 to 2 repeater/buffer. High-speed data paths and flow-through pinout minimize internal device jitter and simplify board layout, while pre-emphasis overcomes ISI jitter effects from lossy backplanes and cables. The differential inputs and outputs interface to LVDS or Bus LVDS signals such as those on National's 10-, 16-, and 18- bit Bus LVDS SerDes, or to CML or LVPECL signals. Integrated IEEE 1149.1 (JTAG) and 1149.6 circuitry supports testability of both single-ended LVTTL/CMOS and high-speed differential PCB interconnects. The 3.3V supply, CMOS process, and robust I/O ensure high performance at low power over the entire industrial -40 to +85°C temperature range.

Also Recommended DS15MB200▲ For Version Without IEEE 1149.1 (JTAG) MY BRIEFCASE                                       Click any "Briefcase" icon to add an item

Typical Application *click for larger image	Block Diagram *click for larger image
Typical Performance *click for larger image

Datasheet

Title		Size	Date	Other Language
	SCAN15MB200 Dual 1.5 Gbps 2:1/1:2 LVDS Mux/Buffer with Pre-Emphasis and IEEE 1149.6	602 Kbytes	19-May-06

Featured Application Notes

Title		Size	Date	Other Language
	AN-1106: AN-1106 100BASE-X Repeater Management Module	1137 Kbytes	4-Oct-04

More Application Notes

Title		Size	Date	Other Language
	AN-770: PC16552C Dual UART/DMA Micro Channel Adapter	355 Kbytes	5-Aug-95

Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
SCAN15MB200TSQ	CMOS8	1	13140	55	0	1615500	3	458102536
SCAN15MB200TSQX	CMOS8	1	13140	55	0	1615500	3	458102536

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.