Features (VS = 5V, TA = 25°C, typical values unless specified). Input offset voltage 0.2mV Input offset voltage (max over temp) 1mV Input bias current 0.2pA Propagation delay (OD = 50mV) 120 nsec Low supply current 300μA CMRR 100dB PSRR 110dB Extended Temperature Range −40°C to 125°C Push-pull output Ideal for 2.7V and 5V single supply applications Available in space-saving packages:  6-Pin SOT-23 (single w/shutdown)  8-Pin SOIC (single w/shutdown)  8-Pin SOIC/MSOP (dual without shutdown) Description The LMV761/LMV762 are precision comparators intended for applications requiring low noise and low input offset voltage. The LV761 single has a shutdown pin that can be used to disable the device and reduce the supply current. The LMV761 is available in a space saving 6-Pin SOT-23 or 8-Pin SOIC package. The LMV762 dual is available in 8-Pin SOIC or MSOP package. They feature a CMOS input and Push-Pull output stage. The Push-Pull output stage eliminates the need for an external pull-up resistor. The LMV761/LMV762 are designed to meet the demands of small size, low power and high performance required by portable and battery operated electronics. The input offset voltage has a typical value of 200μV at room temp and a 1mV limit over temp. Applications • Portable and battery-powered systems • Scanners • Set top boxes • High speed differential line receiver • Window comparators • Zero-crossing detectors • High speed sampling circuits

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	Connection Diagram *click for larger image *click for larger image
Typical Performance click for larger image

Datasheet

Title		Size	Date	Other Language
	LMV761/LMV762 Low Voltage, Precision Comparator with Push-Pull Output	340 Kbytes	31-Oct-08

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Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
LMV761MA	CS080	0	30535	0	0	2810500	2	797458048
LMV761MAX	CS080	0	30535	0	0	2810500	2	797458048
LMV761MF	CS080	0	30535	0	0	2810500	2	797458048
LMV761MFX	CS080	0	30535	0	0	2810500	2	797458048

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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