Datasheet
Package Availability, Models, Samples & Pricing
General Description
The LME49720 is part of the ultra-low distortion, low noise, high slew rate operational amplifier series optimized and fully
specified for high performance, high fidelity applications. Combining advanced leading-edge process technology with state-of-the-art
circuit design, the LME49720 audio operational amplifiers deliver superior audio signal amplification for outstanding audio
performance. The LME49720 combines extremely low voltage noise density (2.7nV/
√
^Hz) with vanishingly low THD+N (0.00003%) to easily satisfy the most demanding audio applications. To ensure that the most challenging
loads are driven without compromise, the LME49720 has a high slew rate of ±20V/μs and an output current capability of ±26mA.
Further, dynamic range is maximized by an output stage that drives 2kΩ loads to within 1V of either power supply voltage and
to within 1.4V when driving 600Ω loads.
The LME49720's outstanding CMRR (120dB), PSRR (120dB), and VOS (0.1mV) give the amplifier excellent operational amplifier DC performance.
The LME49720 has a wide supply range of ±2.5V to ±17V. Over this supply range the LME49720’s input circuitry maintains excellent
common-mode and power supply rejection, as well as maintaining its low input bias current. The LME49720 is unity gain stable.
This Audio Operational Amplifier achieves outstanding AC performance while driving complex loads with values as high as 100pF.
The LME49720 is available in 8–lead narrow body SOIC, 8–lead Plastic DIP, and 8–lead Metal Can TO-99. Demonstration boards
are available for each package.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LME49720HA | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LME49720MA | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LME49720MAX | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LME49720NA | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
More Application Notes
| Title | Size in Kbytes |
Date |
 |
| AN-1767: Application Note 1767 LME49721 Evaluation Board |
649 Kbytes |
24-Feb-08 |
Download |
AN-1767 (Chinese): Application Note 1767 LME49721 Evaluation Board
|
787 Kbytes |
|
 |
[Information as of 7-Nov-2009]
|