Features • Pin-selectable bandwidth and quiescent current • Pure fidelity. Pure performance • Short circuit protection • Thermal shutdown • TO–263 surface-mount package Description The LME49600 is a high performance, low distortion high fidelity 250mA audio buffer. The LME49600 is designed for a wide range of applications. It can be used inside the feedback loop of op amps. The LME49600 offers a pin-selectable bandwidth: a low current, 110MHz bandwidth mode that consumes 7.3mA and a wide 180MHz bandwidth mode that consumes 13.2mA. In both modes the LME49600 has a nominal 2000V/μs slew rate. Bandwidth is easily adjusted by either leaving the BW pin unconnected or connecting a resistor between the BW pin and the VEE pin. The LME49600 is fully protected through internal current limit and thermal shutdown. Key Specification ■  Low THD+N   (VOUT = 3VRMS, f = 1kHz, Figure 2) 0.00003% (typ) ■  Slew Rate 2000V/μs (typ) ■  High Output Current 250mA (typ) ■  Bandwidth     BW pin floating 110MHz (typ)   BW connected to VEE 180MHz (typ) ■  Supply Voltage Range ±2.25V ≤ VS ≤ ±18V Applications • Headphone amplifier output drive stage • Line drivers • Low power audio amplifiers • High-current operational amplifier output stage • ATE Pin Driver Buffer • Power supply regulator

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Typical Application *click for larger image	Block Diagram click for larger image
Typical Performance *click for larger image

Datasheet

Title		Size	Date	Other Language
	LME49600  High Performance, High Fidelity, High Current Audio Buffer	433 Kbytes	31-Mar-08

Featured Application Notes

Title		Size	Date	Other Language
	AN-1768: Application Note 1768 LME49600 Headphone Amplifier Evaluation Board User's Guide	533 Kbytes	29-Feb-08
	AN-1922: Application Note 1922 LM48511 Evaluation Board User`s Guide	1586 Kbytes	5-Nov-08

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Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
LME49600TS	VIP III	0	15575	0	0	1212500	3	344050185

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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