Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| LM8333 Mobile I/O Companion Supporting Key-Scan, I/O Expansion, PWM, and ACCESS.bus Host Interface |
626 Kbytes |
21-Aug-07 |
Download |
Package Availability, Models, Samples & Pricing
General Description
The LM8333 Mobile I/O Companion offloads the burden of keyboard scanning from the host, while providing extremely low power
consumption in both operational and standby modes. It supports keypad matrices up to 8 × 8 in size (plus another 8 special-function
keys), for portable applications such as cellphones, PDAs, games, and other handheld applications.
Key press and release events are encoded into a byte format and loaded into a FIFO buffer for retrieval by the host processor.
An interrupt output (IRQ) is used to signal events such as keypad activity, a state change on either of two interrupt-capable
general-purpose I/O pins, or an error condition. Interrupt and error codes are available to the host by reading dedicated
registers.
Four general-purpose I/O pins are available, two of which have interrupt capability. A pulse-width modulated output based
on a host-programmable internal timer is also available, which can be used as a general-purpose output if the PWM function
is not required.
To minimize power, the LM8333 automatically enters a low-power standby mode when there is no keypad, I/O, or host activity.
The device is packaged in a 32–pin Leadless Leadframe package (LLP) and a 49-pin MICRO-ARRAY . Both are chip-scale packages.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LM8333FLQ8X | CMOS8T | 0 | 16395 | 0 | 0 | 1780000 | 2 | 505079860
|
|
LM8333FLQ8Y | CMOS8T | 0 | 16395 | 0 | 0 | 1780000 | 2 | 505079860
|
|
LM8333GGR8 | CMOS8T | 0 | 16395 | 0 | 0 | 1780000 | 2 | 505079860
|
|
LM8333GGR8X | CMOS8T | 0 | 16395 | 0 | 0 | 1780000 | 2 | 505079860
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
 |
|
|
| Evaluation Kit for LM8333 Device |
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View |
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[Information as of 4-Jul-2009]
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