Features • Automotive grade / AEC Q-100 • Wide operating input voltage range: +5.5V to +65V • Less than 15 µA quiescent current in disabled mode • Controlled output rise time for safe connection of capacitive loads • Charge pump gate driver for external N-Channel MOSFET • Adjustable Under-Voltage Lock-Out (UVLO) with hysteresis • UVLO serves as second enable input for systems requiring safety redundancy • Programmable fault detection delay time • MOSFET latched off after load fault is detected • Active low open drain POWER GOOD (nPGD) output • Adjustable input Over-Voltage Protection (OVP) • Immediate restart after Over-Voltage shutdown Description The LM5060 high-side protection controller provides intelligent control of a high-side N-Channel MOSFET during normal on/off transitions and fault conditions. In-rush current is controlled by the nearly constant rise time of the output voltage. A power good output indicates when the output voltage reaches the input voltage and the MOSFET is fully on. Input Under-Voltage Lock-Out, with hysteresis, is provided as well as programmable input Over-Voltage Protection. An enable input provides remote On / Off control. The programmable Under-Voltage Lock-Out input can be used as second enable input for safety redundancy. A single capacitor programs the initial start-up VGS fault detection delay time, the transition VDS fault detection delay time, and the continuous Over-Current VDS fault detection delay time. When a detected fault condition persists longer than the allowed fault delay time, the MOSFET is latched off until either the Enable input or the Under-Voltage Lock-Out input is toggled low and then high. Applications • Automotive Body Electronics • Industrial Power Distribution and Control

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Datasheet

Title		Size	Date	Other Language
	LM5060Q1 High-Side Protection Controller with Low Quiescent Current	507 Kbytes	3-Nov-09

Featured Application Notes

Title		Size	Date	Other Language
	AN-2000: Application Note 2000 LM5060EVAL Evaluation Board	1654 Kbytes	3-Nov-09

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Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
LM5060Q1MM	ABCD150XV1	0	3868	0	0	2595000	2	736338335
LM5060Q1MMX	ABCD150XV1	0	3868	0	0	2595000	2	736338335

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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