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Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LM4992SD | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
|
LM4992SDX | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
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