Features • AECQ-100 Grade 1 • Up to 400 Mbps switching rates • Flow-through pinout simplifies PCB layout • 50 ps typical driver channel-to-channel skew • 50 ps typical receiver channel-to-channel skew • 3.3 V single power supply design • TRI-STATE output control • Internal fail-safe biasing of receiver inputs • Low power dissipation (70 mW at 3.3 V static) • High impedance on LVDS outputs on power down • Conforms to TIA/EIA-644-A LVDS Standard • Available in low profile 16 pin TSSOP package Description The DS90LV049Q is a dual CMOS flow-through differential line driver-receiver pair designed for applications requiring ultra low power dissipation, exceptional noise immunity, and high data throughput. The device is designed to support data rates in excess of 400 Mbps utilizing Low Voltage Differential Signaling (LVDS) technology. The DS90LV049Q drivers accept LVTTL/LVCMOS signals and translate them to LVDS signals. The receivers accept LVDS signals and translate them to 3 V CMOS signals. The LVDS input buffers have internal failsafe biasing that places the outputs to a known H (high) state for floating receiver inputs. In addition, the DS90LV049Q supports a TRI-STATE function for a low idle power state when the device is not in use. The EN and ^EN inputs are ANDed together and control the TRI-STATE outputs. The enables are common to all four gates.

Also Recommended DS90LV027AQ▲ Automotive Dual LVDS Driver DS90LV028AQ▲ Automotive Dual LVDS Receiver MY BRIEFCASE                                       Click any "Briefcase" icon to add an item

Typical Application click for larger image	Block Diagram click for larger image
Typical Performance click for larger image

Datasheet

Title		Size	Date	Other Language
	DS90LV049Q Automotive LVDS Dual Line Driver and Receiver Pair	308 Kbytes	1-Dec-08

Featured Application Notes

Title		Size	Date	Other Language
	AN-1110: Application Note 1110 LVDS Quad Dynamic I CC vs Frequency	159 Kbytes	4-Oct-04

More Application Notes

Title		Size	Date	Other Language
	AN-971: Application Note 971 An Overview of LVDS Technology	168 Kbytes	5-Oct-98	日本語

Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
DS90LV049QMT	CMOS7	0	18406	0	0	1089000	4	309006723
DS90LV049QMTX	CMOS7	0	18406	0	0	1089000	4	309006723

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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