Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
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| DS90CR215/DS90CR216 +3.3V Rising Edge Data Strobe LVDS 21-Bit Channel Link - 66 MHz |
434 Kbytes |
7-Jun-09 |
Download |
DS90CR215/DS90CR216 +3.3V Rising Edge Data Strobe LVDS 21-Bit Channel Link - 66 MHz (Japanese)
 |
999 Kbytes |
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Package Availability, Models, Samples & Pricing
General Description
The DS90CR215 transmitter converts 21 bits of CMOS/TTL data into three LVDS (Low Voltage Differential Signaling) data streams.
A phase-locked transmit clock is transmitted in parallel with the data streams over a fourth LVDS link. Every cycle
of the transmit clock 21 bits of input data are sampled and transmitted. The DS90CR216 receiver converts the LVDS data
streams back into 21 bits of CMOS/TTL data. At a transmit clock frequency of 66 MHz, 21 bits of TTL data are transmitted
at a rate of 462 Mbps per LVDS data channel. Using a 66 MHz clock, the data throughput is 1.386 Gbit/s (173 Mbytes/s).
The multiplexing of the data lines provides a substantial cable reduction. Long distance parallel single-ended buses typically
require a ground wire per active signal (and have very limited noise rejection capability). Thus, for a 21-bit wide
data and one clock, up to 44 conductors are required. With the Channel Link chipset as few as 9 conductors (3 data pairs,
1 clock pair and a minimum of one ground) are needed. This provides a 80% reduction in required cable width, which provides
a system cost savings, reduces connector physical size and cost, and reduces shielding requirements due to the cables'
smaller form factor.
The 21 CMOS/TTL inputs can support a variety of signal combinations. For example, five 4-bit nibbles plus 1 control, or
two 9-bit (byte + parity) and 3 control.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
DS90CR215MTD | .35 | 0 | 18700 | 0 | 0 | 1290000 | 3 | 366041022
|
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DS90CR215MTDX | .35 | 0 | 18700 | 0 | 0 | 1290000 | 3 | 366041022
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
|
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| Channel Link Design Guide |
3173 Kbytes |
29-Mar-2007 |
View Online |
Download |
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| 28-Bit Channel Link Serializer / Deserializer Evaluation Board 20-85MHz |
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View |
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[Information as of 4-Jul-2009]
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