Features • DC - 3.125 Gbps low jitter, low skew, low power operation • Pin configurable, fully differential, non-blocking architecture • On-chip 100Ω input and output terminations minimize return losses, reduce component count and minimize board space • 8 kV ESD on LVDS I/O pins protects adjoining components • Small 4 mm x 4 mm LLP-16 space saving package Description The DS25CP152 is a 3.125 Gbps 2x2 LVDS crosspoint switch optimized for high-speed signal routing and switching over lossy FR-4 printed circuit board backplanes and balanced cables. Fully differential signal paths ensure exceptional signal integrity and noise immunity. The non-blocking architecture allows connections of any input to any output or outputs. Wide input common mode range allows the switch to accept signals with LVDS, CML and LVPECL levels; the output levels are LVDS. A very small package footprint requires a minimal space on the board while the flow-through pinout allows easy board layout. Each differential input and output is internally terminated with a 100Ω resistor to lower device return losses, reduce component count and further minimize board space. Applications • High-speed channel select applications • Clock and data buffering and muxing • OC-48 / STM-16 • SD/HD/3G HD SDI Routers

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Datasheet

Title		Size	Date	Other Language
	DS25CP152 3.125 Gbps LVDS 2x2 Crosspoint Switch	291 Kbytes	5-Mar-09

Featured Application Notes

Title		Size	Date	Other Language
	AN-1957: Application Note 1957 LVDS Signal Conditioners Reduce Data-Dependent Jitter	1049 Kbytes	23-Apr-09

More Application Notes

Title		Size	Date	Other Language
	AN-1971: Application Note 1971 Triple Rate SDI IP FPGA Resource Utilization on the SDXILEVK/AES-EXP-SDI-G Reference Design	195 Kbytes	6-May-09

Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
DS25CP152TSQ	BICMOS8B+	0	1152	0	0	743900	5	211083656
DS25CP152TSQX	BICMOS8B+	0	1152	0	0	743900	5	211083656

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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