SPI/QSPI/MICROWIRE/DSP compatible Serial Interface
Description
The ADC121S625 is a 12-bit, 50 ksps to 200 ksps sampling Analog-to-Digital (A/D) converter that features a fully differential, high impedance analog input and an external reference. While best performance is achieved with reference voltage between 500mV and 2.5V, the reference voltage can be varied from 100mV to 2.5V, with a corresponding resolution between 49µV and 1.22mV.
The output serial data is binary 2's complement, and is compatible with several standards, such as SPI, QSPI, MICROWIRE, and with many common DSP serial interfaces. The differential input, low power, automatic power down, and small size make the ADC121S625 ideal for direct connection to transducers in battery operated systems or remote data acquisition applications.
Operating from a single +5V supply, the normal power consumption is reduced to a few nanowatts in the power-down mode. The ADC121S625 is a pin-compatible superior replacement for the ADS7817 and is available in the MSOP-8 package. Operation is guaranteed over the industrial temperature range of -40°C to +85°C and clock rates of 800 kHz to 3.2 MHz.
The ADC121S625 is a 12-Bit, 50 ksps to 200 ksps, Differential Input, Micro Power Sampling A/D Converter
The ADC121S625EVAL Design Kit (consisting of the ADC121S625 Evaluation Board and this Users Guide) are designed to ease evaluation and design-in of the National Semiconductor ADC121S625 12-bit Analog-to-Digital Converter, which can operate at speeds up to 200 kSPS. The evaluation board can be used in either of two modes. In the Manual mode, suitable test equipment, such as a logic analyzer, can be used with the board to evaluate the ADC121S625s performance.
Features:
True Differential Inputs
Guaranteed performance from 50ksps to 200ksps
External Reference
High AC Common-Mode Rejection
SPI/QSPI/MICROWIRE/DSP compatible Serial Interface
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
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