Datasheet
Package Availability, Models, Samples & Pricing
General Description
The ADC10D1000/1500 is the latest advance in National's Ultra-High-Speed ADC family. This low-power, high-performance CMOS
analog-to-digital converter digitizes signals at 10-bit resolution for dual channels at sampling rates of up to 1.0/1.5 GSPS
(Non-DES Mode) or for a single channel up to 2.0/3.0 GSPS (DES Mode). The ADC10D1000/1500 achieves excellent accuracy and
dynamic performance while dissipating less than 2.8/3.6 Watts. The product is packaged in a leaded or lead-free 292-ball
thermally enhanced BGA package over the rated industrial temperature range of
-40°C to +85°C.
The ADC10D1000/1500 builds upon the features, architecture and functionality of the 8-bit GHz family of ADCs. An expanded
feature set includes AutoSync for multi-chip synchronization,
15-bit programmable gain and 12-bit plus sign programmable offset adjustment for each channel. The improved internal track-and-hold
amplifier and the extended self-calibration scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing
9.1/9.0 Effective Number of Bits (ENOB) with a 100 MHz input signal and a 1.0/1.5 GHz sample rate while providing a 10
-18 Code Error Rate (CER) Dissipating a typical 2.77/3.59 Watts in Non-Demultiplex Mode at 1.0/1.5 GSPS from a single 1.9V supply,
this device is guaranteed to have no missing codes over the full operating temperature range.
Each channel has its own independent DDR Data Clock, DCLKI and DCLKQ, which are in phase when both channels are powered up,
so that only one Data Clock could be used to capture all data, which is sent out at the same rate as the input sample clock.
If the 1:2 Demux Mode is selected, a second 10-bit LVDS bus becomes active for each channel, such that the output data rate
is sent out two times slower to relax data-capture timing requirements. The part can also be used as a single 2.0/3.0 GSPS
ADC to sample one of the I or Q inputs. The output formatting can be programmed to be offset binary or two's complement and
the Low Voltage Differential Signaling (LVDS) digital outputs are compatible with IEEE 1596.3-1996, with the exception of
an adjustable common mode voltage between 0.8V and 1.2V to allow for power reduction for well-controlled back planes.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC10D1000CIUT | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
[Information as of 7-Nov-2009]
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