Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
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| ADC083000 8-Bit, 3 GSPS, High Performance, Low Power A/D Converter |
1260
Kbytes |
6-Jul-09 |
Download |
ADC083000 8-Bit, 3 GSPS, High Performance, Low Power A/D Converter (Japanese)
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1097 Kbytes |
|
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Package Availability, Models, Samples & Pricing
General Description
The ADC083000 is a single, low power, high performance CMOS analog-to-digital converter that digitizes signals to 8 bits resolution
at sampling rates up to 3.4 GSPS. Consuming a typical 1.9 Watts at 3 GSPS from a single 1.9 Volt supply, this device is guaranteed
to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the
fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration
scheme enable an excellent response of all dynamic parameters up to Nyquist, producing a high 7.0 Effective Number Of Bits,
(ENOB) with a 748 MHz input signal and a 3 GHz sample rate while providing a 10
-18 Word Error Rate. The ADC083000 achieves a 3 GSPS sampling rate by utilizing both the rising and falling edge of a 1.5 GHz
input clock. Output formatting is offset binary and the LVDS digital outputs are compatible with IEEE 1596.3-1996, with the
exception of an adjustable common mode voltage between 0.8V and 1.15V.
The ADC has a 1:4 demultiplexer that feeds four LVDS buses and reduces the output data rate on each bus to a quarter of the
sampling rate.
The converter typically consumes less than 25 mW in the Power Down Mode and is available in a 128-lead, thermally enhanced
exposed pad LQFP and operates over the Industrial (-40°C
≤ TA
≤ +85°C) temperature range.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC083000CIYB | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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| Evaluation Boards & Development Systems |
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View |
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Reference Designs
Application Notes
| Title | Size in Kbytes |
Date |
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| AN-1727: Application Note 1727 Calibrating the ADC08xxxx Family of Ultra High-Speed Converters |
72
Kbytes |
6-Mar-08 |
Download |
AN-1727 (Japanese): Application Note 1727 Calibrating the ADC08xxxx Family of Ultra High-Speed Converters
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76 Kbytes |
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AN-1727 (Chinese): Application Note 1727 Calibrating the ADC08xxxx Family of Ultra High-Speed Converters
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216 Kbytes |
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[Information as of 7-Nov-2009]
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