Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
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| ADC14L020 14-Bit, 20 MSPS, 150 mW A/D Converter |
915
Kbytes |
30-Mar-06 |
Download |
ADC14L020 14-Bit, 20 MSPS, 150 mW A/D Converter (Japanese)
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946 Kbytes |
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Package Availability, Models, Samples & Pricing
General Description
The ADC14L020 is a low power monolithic CMOS analog-to-digital converter capable of converting analog input signals into 14-bit digital words at 20 Megasamples per second (MSPS). This converter uses a differential, pipeline architecture with digital error correction and an on-chip sample-and-hold circuit to minimize power consumption while providing excellent dynamic performance and a 150 MHz Full Power Bandwidth. Operating on a single +3.3V power supply, the ADC14L020 achieves 12.0 effective bits at nyquist and consumes just 150 mW at 20 MSPS . The Power Down feature reduces power consumption to 15 mW.
The differential inputs provide a full scale differential input swing equal to 2 times VREF with the possibility of a single-ended input. Full use of the differential input is recommended for optimum performance. Duty cycle stabilization and output data format are selectable using a quad state function pin. The output data can be set for offset binary or two's complement.
To ease interfacing to lower voltage systems, the digital output driver power pins of the ADC14L020 can be connected to a separate supply voltage in the range of 2.4V to the analog supply voltage.
This device is available in the 32-lead LQFP package and will operate over the industrial temperature range of -40°C to +85°C. An evaluation board is available to ease the evaluation process.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
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ADC14L020CIVY | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
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Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
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| Evaluation Boards & Development Systems |
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[Information as of 7-Nov-2009]
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