Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| ADC12L066 12-Bit, 66 MSPS, 450 MHz Bandwidth A/D Converter with Internal Sample-and-Hold |
598
Kbytes |
13-May-09 |
Download |
ADC12L066 12-Bit, 66 MSPS, 450 MHz Bandwidth A/D Converter with Internal Sample-and-Hold (Japanese)
 |
1108 Kbytes |
|
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Package Availability, Models, Samples & Pricing
| Obsolete Part | Alternate Part or
Supplier | Source | Last Time Buy Date |
ADC12L066CIVYX
| NONE
| NATIONAL SEMICONDUCTOR
| 16 Nov 2008
|
General Description
The ADC12L066 is a monolithic CMOS analog-to-digital converter capable of converting analog input signals into 12-bit digital
words at 66 Megasamples per second (Msps), minimum, with typical operation possible up to 80 Msps. This converter uses a differential,
pipeline architecture with digital error correction and an on-chip sample-and-hold circuit to minimize die size and power
consumption while providing excellent dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of
450 MHz. Operating on a single 3.3V power supply, this device consumes just
357 mW at
66 Msps, including the reference current. The Power Down feature reduces power consumption to just
50 mW.
The differential inputs provide a full scale input swing equal to ±VREF with the possibility of a single-ended input. Full use of the differential input is recommended for optimum performance.
For ease of use, the buffered, high impedance, single-ended reference input is converted on-chip to a differential reference
for use by the processing circuitry. Output data format is 12-bit offset binary.
This device is available in the 32-lead LQFP package and will operate over the industrial temperature range of −40°C to +85°C.
An evaluation board is available to facilitate the evaluation process.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC12L066CIVY | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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| Evaluation Boards & Development Systems |
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View |
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[Information as of 8-Nov-2009]
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