Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| ADC12DL066 Dual 12-Bit, 66 Msps, 450 MHz Input Bandwidth A/D Converter w/Internal Reference |
509
Kbytes |
1-Feb-08 |
Download |
ADC12DL066 Dual 12-Bit, 66 Msps, 450 MHz Input Bandwidth A/D Converter w/Internal Reference (Japanese)
 |
994 Kbytes |
|
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Package Availability, Models, Samples & Pricing
General Description
The ADC12DL066 is a dual, low power monolithic CMOS analog-to-digital converter capable of converting analog input signals
into 12-bit digital words at 66 Megasamples per second (Msps), minimum. This converter uses a differential, pipeline architecture
with digital error correction and an on-chip sample-and-hold circuit to minimize die size and power consumption while providing
excellent dynamic performance and a 450 MHz Full Power Bandwidth. Operating on a single 3.3V power supply, the ADC12DL066
achieves 10.7 effective bits and consumes just 686 mW at 66 Msps, including the reference current. The Power Down feature
reduces power consumption to 75 mW.
The differential inputs provide a full scale differential input swing equal to 2 times VREF with the possibility of a single-ended input. Full use of the differential input is recommended for optimum performance.
The digital outputs from the two ADCs are available on separate 12-bit buses with an output data format choice of offset binary
or two’s complement.
To ease interfacing to lower voltage systems, the digital output driver power pins of the ADC12DL066 can be connected to a
separate supply voltage in the range of 2.4V to the digital supply voltage.
This device is available in the 64-lead TQFP package and will operate over the industrial temperature range of −40°C to +85°C.
An evaluation board is available to ease the evaluation process.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC12DL066CIVS | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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| Evaluation Boards & Development Systems |
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[Information as of 8-Nov-2009]
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