Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| ADC10040/ADC10040Q 10-Bit, 40 MSPS, 3V, 55.5 mW A/D Converter |
457
Kbytes |
20-Oct-09 |
Download |
ADC10040/ADC10040Q 10-Bit, 40 MSPS, 3V, 55.5 mW A/D Converter (Japanese)
 |
715 Kbytes |
|
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Package Availability, Models, Samples & Pricing
General Description
The ADC10040 is a monolithic CMOS analog-to-digital converter capable of converting analog input signals into 10-bit digital
words at 40 Megasamples per second (MSPS). This converter uses a differential, pipeline architecture with digital error correction
and an on-chip sample-and-hold circuit to provide a complete conversion solution, and to minimize power consumption, while
providing excellent dynamic performance. A unique sample-and-hold stage yields a full-power bandwidth of
400 MHz. Operating on a single 3.0V power supply, this device consumes just
55.5 mW at
40 MSPS, including the reference current. The Standby feature reduces power consumption to just
13.5 mW.
The differential inputs provide a full scale selectable input swing of 2.0 VP-P, 1.5 VP-P, 1.0 VP-P, with the possibility of a single-ended input. Full use of the differential input is recommended for optimum performance.
An internal +1.2V precision bandgap reference is used to set the ADC full-scale range, and also allows the user to supply
a buffered referenced voltage for those applications requiring increased accuracy. The output data format is user choice of
offset binary or two’s complement.
The ADC10040Q runs on an Automotive Grade Flow and is AEC-Q100 Grade 3 Qualified.
This device is available in the 28-lead TSSOP package and will operate over the industrial temperature range of −40°C to
+85°C.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC10040CIMT | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
|
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ADC10040CIMTX | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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| Evaluation Boards & Development Systems |
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[Information as of 8-Nov-2009]
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