Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
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| ADC08B200 / ADC08B200Q 8-Bit, 200 MSPS A/D Converter with Capture Buffer |
639 Kbytes |
20-Oct-09 |
Download |
ADC08B200 / ADC08B200Q 8-Bit, 200 MSPS A/D Converter with Capture Buffer (Japanese)
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809 Kbytes |
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Package Availability, Models, Samples & Pricing
General Description
The ADC08B200 is a high speed analog-to-digital converter (ADC) with an integrated capture buffer. The 8-bit, 200 MSPS A/D
core is based upon the proven ADC08200 with integrated track-and-hold and is optimized for low power consumption. This device
contains a selectable size capture buffer of up to 1,024 bytes that allows fast capture of an input signal with a slower readout
rate. An on-chip clock PLL circuit provides the option of on-chip clock rate multiplication to provide the high speed sampling
clock.
The ADC08B200 is resistant to latch-up and the outputs are short-circuit proof. The top and bottom of the ADC08B200's reference
ladder are available for connections, enabling a wide range of input possibilities. The digital outputs are TTL/CMOS compatible
with a separate output power supply pin to support interfacing with 2.7V to 3.3V logic. The digital inputs and outputs are
low voltage TTL/CMOS compatible and the output data format is straight binary.
The ADC08B200Q runs on an Automotive Grade Flow and is AEC-Q100 Grade 2 Qualified.
The ADC08B200 is offered in a 48-pin plastic package (TQFP) and is specified over the extended industrial temperature range
of −40°C to +105°C. An evaluation board is available to assist in the easy evaluation of the ADC08B200.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC08B200CIVS | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
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ADC08B200QCIVS | CMOS7 | 0 | 18406 | 0 | 0 | 1089000 | 4 | 309006723
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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| Evaluation Boards & Development Systems |
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[Information as of 8-Nov-2009]
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