Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| ADC081000 High Performance, Low Power 8-Bit, 1 GSPS A/D Converter |
580 Kbytes |
21-Apr-09 |
Download |
ADC081000 High Performance, Low Power 8-Bit, 1 GSPS A/D Converter (Japanese)
 |
1198 Kbytes |
|
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Package Availability, Models, Samples & Pricing
General Description
The ADC081000 is a low power, high performance CMOS analog-to-digital converter that digitizes signals to 8 bits resolution
at sampling rates up to 1.6 GSPS. Consuming a typical 1.4 Watts at 1 GSPS from a single 1.9 Volt supply, this device is guaranteed
to have no missing codes over the full operating temperature range. The unique folding and interpolating architecture, the
fully differential comparator design, the innovative design of the internal sample-and-hold amplifier and the self-calibration
scheme enable a very flat response of all dynamic parameters beyond Nyquist, producing a high 7.5 ENOB with a 500 MHz input
signal and a 1 GHz sample rate while providing a 10
-18 B.E.R. Output formatting is offset binary and the LVDS digital outputs are compliant with IEEE 1596.3-1996, with the exception
of a reduced common mode voltage of 0.8V.
The converter has a 1:2 demultiplexer that feeds two LVDS buses, reducing the output data rate on each bus to half the sampling
rate. The data on these buses are interleaved in time to provide a 500 MHz output rate per bus and a combined output rate
of 1 GSPS.
The converter typically consumes less than 10 mW in the Power Down Mode and is available in a 128-lead, thermally enhanced
exposed pad LQFP and operates over the industrial (-40°C
≤ TA
≤ +85°C) temperature range.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
ADC081000CIYB | CMOS9 | 1 | 7327 | 137 | 0 | 1103000 | 4 | 312979261
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
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|
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| National GHz ADC Development Platform for Xilinx FPGAs |
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View |
|
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Application Notes
| Title | Size in Kbytes |
Date |
 |
| AN-1615: Application Note 1615 LMH6555 Evaluation Board |
1307 Kbytes |
22-Jun-07 |
Download |
AN-1615 (Japanese): Application Note 1615 LMH6555 Evaluation Board
 |
1286 Kbytes |
|
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[Information as of 7-Nov-2009]
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