STA400EP - STA400EP IEEE 1149.4 Analog Test Access Device [Obsolete]

Datasheet Packaging Samples & Pricing Reliability Knowledge Base

Features
•Compliant to IEEE 1149.1 and IEEE 1149.4
•Analog mux/demux either dual 2 to 1 or single 4 to 1
•Samples up to 9 Analog test points
•Includes CLAMP and HIGHZ instructions
•TRST# Input
•Input range from -0.5V to +6.5

General Description

This Dual 2 to 1 Analog Mux with IEEE 1149.4 incorporates many features of the IEEE 1149.4 Test Standard. More...


Applications

•Industrial Applications
•Automotive Applications
•Selected Military Applications
•Selected Avionics Applications
  Typical Application
See Datasheet for Application Information

Block Diagram
click for larger image



Datasheet
RoHS Compliance Information Size in KbytesDate Click link below to Download
STA400EP Enhanced Plastic Dual 2:1 Analog Mux with IEEE 1149.4 136 Kbytes 26-Jul-04 Download

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Package Availability, Models, Samples & Pricing
Part NumberPackageFactory Lead TimeModelsSamples &
Electronic
Orders		Budgetary PricingStd
Pack
Size		Package
Marking
Format
TypePinsSpec.MSL
Rating		Peak
Reflow		RoHS
Report		CAD
Symbols		WeeksQtyQty$US each
STA400MTEPTSSOP20RoHS N/A ObsoleteN/A
 1K+$7.50rail
of
73		NSUZXYTT
STA400MT
E
6 weeksN/A

General Description

This Dual 2 to 1 Analog Mux with IEEE 1149.4 incorporates many features of the IEEE 1149.4 Test Standard. The device provides access to up to 9 Analog test points and can be used to sample Analog signals as well as assist in the measurement of passive components. The device can be configured as a dual 2 to 1 multiplexor, or in a single 4 to 1 format. The device is compliant with both IEEE 1149.1 and IEEE 1149.4 Boundary Scan Test Standards.

ENHANCED PLASTIC

  • Extended Temperature Performance of -55°C to +125°C
  • Baseline Control - Single Fab & Assembly Site
  • Process Change Notification (PCN)
  • Qualification & Reliability Data
  • Solder (PbSn) Lead Finish is standard
  • Enhanced Diminishing Manufacturing Sources (DMS) Support

Reliability Metrics

Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
STA400MTEPCMOS7016561009540004270700104

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


[Information as of 4-Jul-2009]