Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| DS14C241 Single Supply TIA/EIA-232 4 x 5 Driver/Receiver |
188
Kbytes |
9-Sep-04 |
Download |
DS14C241 Single Supply TIA/EIA-232 4 x 5 Driver/Receiver (Japanese)
 |
326 Kbytes |
|
 |
Package Availability, Models, Samples & Pricing
| Obsolete Part | Alternate Part or
Supplier | Source | Last Time Buy Date |
DS14C241TWM
| NONE
| NONE
| 08 Sep 1998
|
DS14C241TWMX
| NONE
| NONE
| 08 Sep 1998
|
DS14C241WM
| NONE
| NATIONAL SEMICONDUCTOR
| 01 Dec 2009
|
DS14C241WMX
| NONE
| NATIONAL SEMICONDUCTOR
| 01 Dec 2009
|
General Description
The DS14C241 is four driver, five receiver device which conforms to the TIA/EIA-232-E standard and CCITT V.28 recommendations. This device eliminates ±12V supplies by employing an internal DC-DC converter to generate the necessary output levels from a single +5V supply. Driver slew rate control and receiver noise filtering have also been internalized to eliminate the need for external slew rate control and noise filtering capacitors. With the addition of TRI-STATE®receiver outputs and a shutdown mode, device power consumption is kept to a minimum.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
DS14C241WM | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
DS14C241WMX | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
[Information as of 8-Nov-2009]
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