National Semiconductor | High-performance Analog


 CP3UB26   

Reprogrammable Connectivity Processor with USB and CAN Interfaces [Not recommended for new designs]
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Description

Datasheets
TitleSizeDateOther
Language
CP3UB26 Reprogrammable Connectivity Processor with USB and CAN Interfaces5589
Kbytes
30-Aug-11   

Part Number(s)
(NSID)
Top ViewAvailabilityCurrent Reported StockBudgetary PricingPack
Size
CP3UB26G18NEP/NOPB


RoHS Status


LQFP
Not recommended for new designs
(as of 12-Mar-08)
Lead Time: 12 weeks

 
DistributorRegionQty
DIGI-KEYWorldwide0
$16.70 each at 1K+ pcstray
of
72

Obsolete Versions
Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
CP3UB26Y98NEP
NONE
NATIONAL SEMICONDUCTOR
16 Nov 2008
CP3UB26Y98NEPX
NONE
NATIONAL SEMICONDUCTOR
16 Nov 2008

All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for CP3UB26.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for CP3UB26 is located at RoHS Status.

Part Number(s)
(NSID)
Weight
(milligrams)
TypePinsMSL RatingPeak ReflowRoHS
Status
CAD SymbolsModelsPackage
Marking
Format
CP3UB26G18NEP/NOPB

983.811
986.002
LQFP1283260DetailN/AN/A
NSUZXYYTTE#
CP3UB26G18NEP

All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for CP3UB26.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for CP3UB26 is located at RoHS Status.

CAD Symbols and Models
N/A
 Models
N/A


Reliability Metrics
Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
CP3UB26G18NEPCMOS8T0167100017800002505079860

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

For more information on Reliability Metrics, please click here.


All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

Moisture Sensitivity Level Data for CP3UB26.

A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

National's certificate of product compliance for CP3UB26 is located at RoHS Status.

Obsolete Versions
Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
CP3UB26Y98NEP
NONE
NATIONAL SEMICONDUCTOR
16 Nov 2008
CP3UB26Y98NEPX
NONE
NATIONAL SEMICONDUCTOR
16 Nov 2008

[Information as of 9-Feb-2012]