National Semiconductor Press Release


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National Semiconductor Introduces Three New Boundary Scan LVDS Products for Wireless Telecom, Data Communications, Video, and Medical Applications Markets

National's SCAN921025 and SCAN921226 10-bit LVDS Serializer and Deserializer provide 30-80MHz Operation, Lock to Random Data Capability for True Live Insertion, IEEE 1149.1 and at-Speed Built-in-Self-Test (BIST) Test Capability; The New Space-Saving SCAN921260UJB Incorporates Six 1:10 LVDS Deserializers

January 28, 2002-National Semiconductor (NYSE:NSM) announced the industry's fastest 10-bit Bus Low Voltage Differential Signaling (LVDS) serializer/deserializer chipset for high-speed data transfer over a single differential pair. Designed to meet the high speed data transfer rates of third-generation wireless base station, video, and medical instrumentation markets, National's SCAN921025 and SCAN921226 is a low power, low noise solution in a form factor that is 30 percent smaller than competitive products.

The company also introduced the SCAN921260UJB, a single highly integrated product that incorporates six 1:10 deserializers with IEEE 1149.1 test capability and Built-In-Self-Test mode that supports data rates up to 66 MHz. By incorporating six deserializers in a single product, National's SCAN921260UJB offers original equipment manufacturers (OEMs) a substantial space savings in printed circuit boards (PCBs) and lower overall costs. The product is ideally suited for wireless base stations and other space-conscious applications.

Boundary SCAN is an industry standard technology that makes device, board and system-level testing faster, easier, and more economical. National's new SCAN System Test Access (STA) products provide the infrastructure for delivering test vectors or reconfiguration / programming files across a standard IEEE 1149.1 test bus in an embedded environment.  STA products also convert the 4-wire IEEE 1149.1 bus into a system level multi-drop test  bus, providing access to TTL and LVDS interconnects in order to verify structural integrity.

"National's new SCAN LVDS products offer the industry's best combination of high speed, low power consumption, and small size available on the market today," said Brian Stearns, marketing manager for System Test Access products. "The high frequency operation and innovative at-speed BIST test mode extends our proven leadership in the markets for LVDS and boundary SCAN enabled products."

About National Semiconductor's SCAN921025 and SCAN921226
The SCAN921025 and SCAN921226 chipset was developed to address clock speeds over 66 MHz, specifically 78.8 MHz for telecom and 74.25 MHz for video applications. The serializer input accepts as many as 10 parallel bits with the associated transmit clock to latch the parallel bits into the device. It serializes them and embeds the clock for serial transport. The deserializer accepts the serial stream, recovers the clock and data, and delivers both to the receiver parallel interface.

The SCAN921025 and SCAN921226 also feature two test modes that provide interconnect test access on and between Low Voltage Differential (LVDS) channels. Boundary scan test access is provided to the digital (TTL) side of the devices using the industry standard IEEE 1149.1 (JTAG) protocol. In addition, the chipset features a JTAG initiated at-speed Built-in-Self-Test (BIST) to verify interconnects at normal system operating frequency.

About National Semiconductor's SCAN921260UJB
National's SCAN921260UJB is ideally suited for applications such as wireless base stations that use multiple deserializers on the same printed circuit board. Integrating six deserializers in the same package reduces overall system cost and saves board space.

National's SCAN921260UJB features three test modes that provide interconnect test access on the device and between LVDS channels. Industry standard IEEE 1149.1 boundary scan test access is provided to the digital transistor-transistor logic (TTL) side of the devices. The product also features an at-speed BIST test mode accessible through the test access port to verify interconnects at the system frequency. In addition, the BIST ALONE mode supports bit error rate testing without activating the 1149.1 test access port for continuous testing with live traffic on adjacent channels. When used with a National SCAN LVDS serializer such as SCAN921023, the complete spectrum of interconnect faults can be detected.

Pricing and Availability
National's SCAN921025 is a 10:1 (TTL to LVDS) serializer with frequency operation of 30 MHz to 80 MHz. It is available in a 7 mm by 7 mm, 49-pin ball grid array (BGA) package and priced at $10.00 each in quantities of 1000 units.

National's SCAN921226 is a 1:10 (LVDS to TTL) deserializer with random lock and frequency operation of 30 MHz to 80 MHZ, also in a 7 mm by 7 mm, 49-pin BGA package. It is priced at $10.00 each in quantities of 1000 units.

National's SCAN921260UJB is offered at $43.78 each in quantities of 1000 units.

For more information on the SCAN921025, SCAN921226 and SCAN921260UJB, visit National's World Wide Web site at http://www.national.com/pf/SC/SCAN921025.html, http://www.national.com/pf/SC/SCAN921226.html and http://www.national.com/pf/SC/SCAN921260.html. For more details on LVDS and Scan products see www.national.com/lvds or www.national.com/scan.

About National Semiconductor
National Semiconductor is the premier analog company driving the information age. Combining real-world analog and state-of-the-art digital technology, the company is focused on the fast growing markets for wireless handsets; displays; information appliances; and information infrastructure. With headquarters in Santa Clara, California, National reported sales of $2.1 billion for its last fiscal year and has about 9,800 employees worldwide. Additional company and product information is available on the World Wide Web at www.national.com
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