September 18, 2000 - National Semiconductor (NYSE:NSM), an innovator in analog semiconductor markets, and LogicVision, a leading provider of embedded test for integrated circuits and systems, today announced the development of the first general-purpose, IEEE 1149.4-compliant integrated circuit (IC). The Analog Test Access prototype, manufactured at National's South Portland, Maine facility, uses LogicVision's embedded test circuitry to provide analog access to board-level circuit nodes.
"For many years board and system designers have benefited from the digital-only IEEE 1149.1 standard and the support provided by the industry," said Brian Stearns, National Semiconductor's strategic marketing manager of System Test Access products. "With the unique capability of this IEEE 1149.4-based device, electrical test is now possible at the analog nodes which previously could not be accessed."
"There is a real need for economical and timely solutions that simplify mixed-signal test automation at the board and system level," added Steve Sunter, director of Mixed-Signal Test at LogicVision and vice-chair of the 1149.4 Working Group. "Our collaboration with National allows us to establish our positions as leaders in the deployment of IEEE 1149.4 mixed-signal test for general use. This is a first step towards achieving that goal."
Advances in circuit board and IC packaging technology have driven extraordinary reductions in circuit board area. With smaller, denser boards, test access has been compromised and fault detection is limited. Digital portions of circuit boards now make extensive use of the familiar IEEE 1149.1 boundary scan standard for high fault coverage automated test generation, and low-cost PC based board test. In order to access Analog test points, an external In-Circuit-Tester (ICT) must still be utilized, and the board layout and shielding must accommodate external probing. The IEEE 1149.4 mixed-signal test standard reduces the need for ICT and allows denser board layouts. The analog test points can then be accessed according to the IEEE 1149.4 standard which defines parametric test facilities and uses the digital IEEE 1149.1 infrastructure.
Both National Semiconductor and LogicVision expect the new chip to accelerate acceptance of the IEEE 1149.4 mixed-signal test standard. Sample quantities will be available in Q4/00 from National as a technology test vehicle.
About LogicVision Inc.
LogicVision, a leading intellectual property (IP) provider, licenses high performance, space efficient embedded test processing engines to communication, wireless and server companies worldwide. LogicVision also provides comprehensive tools, support and methodology consulting to enable customers to develop and deploy a complete Embedded Test methodology at the IC and system level. For more information on the company and its products, please visit the LogicVision web site at www.logicvision.com.
About National Semiconductor
National Semiconductor provides system-on-a-chip solutions for the information age. Combining real-world analog and state-of the-art digital technology, the company's chips lead many sectors of the personal computer, communications, and consumer markets. With headquarters in Santa Clara, California, National reported sales of $2.1 billion for its last fiscal year and has about 10,500 employees worldwide. Additional company and product information is available on the World Wide Web at www.national.com.
