Datasheet
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Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LMC555 MD8 | CMOS | 0 | 19715 | 0 | 0 | 2605000 | 2 | 739175862
|
|
LMC555 MDA | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CM | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CMM | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CMMX | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CMX | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CN | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CTP | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555CTPX | P2CMOS | 0 | 49735 | 0 | 1 | 4330000 | 2 | 556689228
|
|
LMC555J/883 | CMOS | 0 | 19715 | 0 | 0 | 2605000 | 2 | 739175862
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
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