Datasheet
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Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LM7171AMJ-QML | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMJFQMLV | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMWFLQMLV | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMWFQMLV | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMWG-QML | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMWGFLQV | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
|
LM7171AMWGFQMLV | VIP III | 0 | 15575 | 0 | 0 | 1212500 | 3 | 344050185
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
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here.