Datasheet
Package Availability, Models, Samples & Pricing
| Obsolete Part | Alternate Part or
Supplier | Source | Last Time Buy Date |
LM611AIN
| NONE
| NONE
| 10 Mar 1998
|
LM611AMJ/883
| NONE
| NONE
| 05 Mar 2008
|
LM611BIN
| NONE
| NONE
| 10 Mar 1998
|
LM611CN
| NONE
| NONE
| 10 Mar 1998
|
LM611MN
| NONE
| NONE
| 10 Mar 1998
|
General Description
The LM611 consists of a single-supply op-amp and a programmable voltage reference in one space saving 8-pin package. The op-amp out-performs most single-supply op-amps by providing higher speed and bandwidth along with low supply current. This device was specifically designed to lower cost and board space requirements in transducer, test, measurement and data acquisition systems.
Combining a stable voltage reference with a wide output swing op-amp makes the LM611 ideal for single supply transducers, signal conditioning and bridge driving where large common-mode signals are common. The voltage reference consists of a reliable band-gap design that maintains low dynamic output impedance (1 typical), excellent initial tolerance (0.6%), and the ability to be programmed from 1.2V to 6.3V via two external resistors. The voltage reference is very stable even when driving large capacitive loads, as are commonly encountered in CMOS data acquisition systems.
As a member of National's Super-Block™ family, the LM611 is a space-saving monolithic alternative to a multi-chip solution, offering a high level of integration without sacrificing performance.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LM611CM | SLM | 0 | 44046 | 0 | 0 | 3532500 | 1 | 1002356520
|
|
LM611CMX | SLM | 0 | 44046 | 0 | 0 | 3532500 | 1 | 1002356520
|
|
LM611IM | SLM | 0 | 44046 | 0 | 0 | 3532500 | 1 | 1002356520
|
|
LM611IMX | SLM | 0 | 44046 | 0 | 0 | 3532500 | 1 | 1002356520
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
Design Tools
| Title | Size in Kbytes |
Date |
 |
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| Amplifiers Selection Guide software for Windows |
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View |
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[Information as of 8-Nov-2009]
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RoHS Compliance Information
