Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
 |
| LM4835 Boomer ® Audio Power Amplifier Series Stereo 2W Audio Power Amplifiers with DC Volume Control and Selectable Gain |
917 Kbytes |
10-Feb-03 |
Download |
LM4835 Boomer ® Audio Power Amplifier Series Stereo 2W Audio Power Amplifiers with DC Volume Control and Selectable Gain (Japanese)
 |
420 Kbytes |
|
 |
Package Availability, Models, Samples & Pricing
| Obsolete Part | Alternate Part or
Supplier | Source | Last Time Buy Date |
LM4835LQ
| LM4838MTE
| NATIONAL SEMICONDUCTOR
| 05 Mar 2008
|
LM4835LQBD
| LM4857ITLBD
| NATIONAL SEMICONDUCTOR
| 16 Nov 2008
|
LM4835LQX
| NONE
| NATIONAL SEMICONDUCTOR
| 04 May 2006
|
LM4835MT
| NONE
| NATIONAL SEMICONDUCTOR
| 01 Dec 2009
|
LM4835MTE
| NONE
| NATIONAL SEMICONDUCTOR
| 01 Dec 2009
|
LM4835MTEX
| NONE
| NATIONAL SEMICONDUCTOR
| 01 Dec 2009
|
General Description
The LM4835 is a monolithic integrated circuit that provides DC volume control, and stereo bridged audio power amplifiers capable of producing 2W into 4 with less than 1.0% THD or 2.2W into 3 with less than 1.0% THD.
Boomer® audio integrated circuits were designed specifically to provide high quality audio while requiring a minimum amount of external components. The LM4835 incorporates a DC volume control, stereo bridged audio power amplifiers and a selectable gain or bass boost, making it optimally suited for multimedia monitors, portable radios, desktop, and portable computer applications.
The LM4835 features an externally controlled, low-power consumption shutdown mode, and both a power amplifier and headphone mute for maximum system flexibility and performance.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
LM4835MT | CS065 | 2 | 38968 | 52 | 0 | 4402000 | 1 | 1249079519
|
|
LM4835MTE | CS065 | 2 | 38968 | 52 | 0 | 4402000 | 1 | 1249079519
|
|
LM4835MTEX | CS065 | 2 | 38968 | 52 | 0 | 4402000 | 1 | 1249079519
|
|
LM4835MTX | CS065 | 2 | 38968 | 52 | 0 | 4402000 | 1 | 1249079519
|
Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
[Information as of 8-Nov-2009]
|