Features • Adjustable 4V to 6V • Low temperature coefficient • Wide operating current of 600 μA to 10 mA • 0.6Ω dynamic impedance • ± 1% initial tolerance available • Guaranteed temperature stability • Easily trimmed for minimum temperature drift • Fast turn-on • Three lead transistor package Description The LM136-5.0/LM236-5.0/LM336-5.0 integrated circuits are precision 5.0V shunt regulator diodes. These monolithic IC voltage references operate as a low temperature coefficient 5.0V zener with 0.6Ω dynamic impedance. A third terminal on the LM136-5.0 allows the reference voltage and temperature coefficient to be trimmed easily. The LM136-5.0 series is useful as a precision 5.0V low voltage reference for digital voltmeters, power supplies or op amp circuitry. The 5.0V makes it convenient to obtain a stable reference from low voltage supplies. Further, since the LM136-5.0 operates as a shunt regulator, it can be used as either a positive or negative voltage reference. The LM136-5.0 is rated for operation over −55°C to +125°C while the LM236-5.0 is rated over a −25°C to +85°C temperature range. The LM336-5.0 is rated for operation over a 0°C to +70°C temperature range. See the connection diagrams for available packages. For applications requiring 2.5V see LM136-2.5.

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Typical Application *click for larger image	Connection Diagram *click for larger image
Typical Performance click for larger image

Datasheet

Title		Size	Date	Other Language
	LM136-5.0 LM236-5.0 LM336-5.0 5.0V Reference Diode	295 Kbytes	27-Feb-09

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Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
LM336BM-5.0	SLM	0	44046	0	0	3532500	1	1002356520
LM336BMX-5.0	SLM	0	44046	0	0	3532500	1	1002356520
LM336BZ-5.0	SLM	0	44046	0	0	3532500	1	1002356520
LM336M-5.0	SLM	0	44046	0	0	3532500	1	1002356520
LM336MX-5.0	SLM	0	44046	0	0	3532500	1	1002356520
LM336Z-5.0	SLM	0	44046	0	0	3532500	1	1002356520

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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