Features Internally trimmed offset voltage: 5 mV max Low input bias current: 50 pA Low input noise current: 0.01 pA/SqrtHz Wide gain bandwidth: 4 MHz High slew rate: 13 V/µs Low supply current: 7.2 mA High input impedance: 1012 Low total harmonic distortion: <=0.02% Low 1/f noise corner: 50 Hz Fast settling time to 0.01%: 2 µs Description The LF147 is a low cost, high speed quad JFET input operational amplifier with an internally trimmed input offset voltage (BI-FET II™ technology). The device requires a low supply current and yet maintains a large gain bandwidth product and a fast slew rate. In addition, well matched high voltage JFET input devices provide very low input bias and offset currents. The LF147 is pin compatible with the standard LM148. This feature allows designers to immediately upgrade the overall performance of existing LF148 and LM124 designs. The LF147 may be used in applications such as high speed integrators, fast D/A converters, sample-and-hold circuits and many other circuits requiring low input offset voltage, low input bias current, high input impedance, high slew rate and wide bandwidth. The device has low noise and offset voltage drift.

Also Recommended LM6154▲ Wider Bandwidth,faster Slew Rate, Better Power Consumption MY BRIEFCASE                                       Click any "Briefcase" icon to add an item

Typical Application click for larger image	Connection Diagram click for larger image
Typical Performance click for larger image

Datasheet

Title		Size	Date	Other Language
	LF147/LF347 Wide Bandwidth Quad JFET Input Operational Amplifiers	481 Kbytes	13-Sep-04	日本語

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Design Tools

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Amplifiers Selection Guide software for Windows

Reliability Metrics

Part Number	Process	EFR Reject	EFR Sample Size	PPM	LTA Rejects	LTA Device Hours	FITS	MTTF (Hours)
LF347BN	BIFET	0	12875	0	0	1065000	4	302196657
LF347M	BIFET	0	12875	0	0	1065000	4	302196657
LF347MX	BIFET	0	12875	0	0	1065000	4	302196657
LF347N	BIFET	0	12875	0	0	1065000	4	302196657

Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

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