National Semiconductor | High-performance Analog

 

 LF198   

Monolithic Sample and Hold Circuit
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Features
  • Operates from ±5V to ±18V supplies
  • Less than 10 µs acquisition time
  • TTL, PMOS, CMOS compatible logic input
  • 0.5 mV typical hold step at Ch = 0.01 µF
  • Low input offset
  • 0.002% gain accuracy
  • Low output noise in hold mode
  • Input characteristics do not change during hold mode
  • High supply rejection ratio in sample or hold
  • Wide bandwidth
  • Space qualified, JM38510
  • Logic inputs on the LF198 are fully differential with low input current, allowing direct connection to TTL, PMOS, and CMOS. Differential threshold is 1.4V. The LF198 will operate from ±5V to ±18V supplies.

    An "A" version is available with tightened electrical specifications.

    Description

    The LF198/LF298/LF398 are monolithic sample-and-hold circuits which utilize BI-FET technology to obtain ultra-high dc accuracy with fast acquisition of signal and low droop rate. Operating as a unity gain follower, dc gain accuracy is 0.002% typical and acquisition time is as low as 6 µs to 0.01%. A bipolar input stage is used to achieve low offset voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does not degrade input offset drift. The wide bandwidth allows the LF198 to be included inside the feedback loop of 1 MHz op amps without having stability problems. Input impedance of 1010Ohm allows high source impedances to be used without degrading accuracy.

    P-channel junction FET's are combined with bipolar devices in the output amplifier to give droop rates as low as 5 mV/min with a 1 µF hold capacitor. The JFET's have much lower noise than MOS devices used in previous designs and do not exhibit high temperature instabilities. The overall design guarantees no feed-through from input to output in the hold mode, even for input signals equal to the supply voltages.

     

    ParametersValues
    Temperature Min -55 deg C
    Temperature Max 125 deg C
    Offset Voltage max, 25C 2, 5 mV

    Datasheets
    TitleSizeDateOther
    Language
    LF198 Monolithic Sample and Hold Circuit520
    Kbytes
    23-Aug-00日本語  

    Part Number(s)
    (NSID)
    Top ViewAvailabilityCurrent Reported StockBudgetary PricingPack
    Size
    LF198AH/NOPB

    LF198AH

    RoHS Status


    TO-99
    Full production
    Lead Time: 6 weeks

     
    DistributorRegionQty
    DIGI-KEYWorldwide387
    $9.60 each at 1K+ pcsbox
    of
    500

    Obsolete Versions
    Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
    LF198H-MLS
    NONE
    NONE
    08 Sep 1998
    LF198H-SMD
    NONE
    NONE
    08 Sep 1999
    LF198WG-MLS
    JL198SGA
    NATIONAL SEMICONDUCTOR
    03 Dec 2008
    LF198WG/883
    LF198H/883
    NATIONAL SEMICONDUCTOR
    01 Dec 2009

    All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

    Moisture Sensitivity Level Data for LF198.

    A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

    National's certificate of product compliance for LF198 is located at RoHS Status.

    Part Number(s)
    (NSID)
    Weight
    (milligrams)
    TypePinsMSL RatingPeak ReflowRoHS
    Status
    CAD SymbolsModelsPackage
    Marking
    Format
    LF198AH/NOPB

    LF198AH
    969.917
    971.007
    TO-9981
    1
    NA
    NA
    DetailN/AN/A
    NSZXYTTE# LF198AH

    All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

    Moisture Sensitivity Level Data for LF198.

    A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

    National's certificate of product compliance for LF198 is located at RoHS Status.

    CAD Symbols and Models
    N/A
     Models
    N/A


    Reliability Metrics
    Part Number Process EFR Reject EFR Sample Size PPM LTA Rejects LTA Device Hours FITS MTTF (Hours)
    LF198AHBIFET0128750010650004302196657

    Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR. The Long Term Failure Rates were calculated at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress temperature of 150°C to an application temperature of 55°C.

    For more information on Reliability Metrics, please click here.


    All information pertaining to the RoHS Compliance Standard can be found at http://www.national.com/en/packaging/leadfree.html.

    Moisture Sensitivity Level Data for LF198.

    A RoHS compliance or an IPC 1752 report can be acquired at http://www.national.com/en/packaging/greennopb.html.

    National's certificate of product compliance for LF198 is located at RoHS Status.

    Obsolete Versions
    Obsolete PartAlternate Part or SupplierSourceLast Time Buy Date
    LF198H-MLS
    NONE
    NONE
    08 Sep 1998
    LF198H-SMD
    NONE
    NONE
    08 Sep 1999
    LF198WG-MLS
    JL198SGA
    NATIONAL SEMICONDUCTOR
    03 Dec 2008
    LF198WG/883
    LF198H/883
    NATIONAL SEMICONDUCTOR
    01 Dec 2009

    [Information as of 9-Feb-2012]