Datasheet
RoHS Compliance Information
| Size in Kbytes | Date |
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| DS485 Low Power RS-485/RS-422 Multipoint Transceiver |
550 Kbytes |
19-Nov-04 |
Download |
DS485 Low Power RS-485/RS-422 Multipoint Transceiver (Japanese)
 |
267 Kbytes |
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Package Availability, Models, Samples & Pricing
| Obsolete Part | Alternate Part or
Supplier | Source | Last Time Buy Date |
DS485TN
| LTC485
| LINEAR TECHNOLOGY
| 16 Nov 2008
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General Description
The DS485 is a low-power transceiver for RS-485 and RS-422 communication. The device contains one driver and one receiver. The drivers slew rate allows for operation up to 2.5 Mbps (see Applications Information section).
The transceiver draws 200 µA of supply current when unloaded or fully loaded with the driver disabled and operates from a single +5V supply.
The driver is short-circuit current limited and is protected against excessive power dissipation by thermal shutdown circuitry that places the driver outputs into TRI-STATE® (High Impedance state) under fault conditions. The driver guarantees a minimum of 1.5V differential output voltage with maximum loading across the common mode range (VOD3).
The receiver has a failsafe feature that guarantees a logic-high output if the input is open circuit.
The DS485 is available in surface mount and DIP packages and is characterized for Industrial and Commercial temperature range operation.
Reliability Metrics
| Part Number |
Process |
EFR Reject |
EFR Sample Size |
PPM |
LTA Rejects |
LTA Device Hours |
FITS |
MTTF (Hours) |
|
DS485M | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
|
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DS485MX | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
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DS485N | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
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DS485TM | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
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DS485TMX | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
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DS485TN | LMDMOS | 0 | 17710 | 0 | 0 | 2470000 | 2 | 700869244
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Note: The Early Failure Rates (EFR) were calculated as point estimate PPM based on rejects and sample size for EFR.
The Long Term Failure Rates were calculated
at 60% confidence using the Arrhenius equation at 0.7eV activation energy and derating the assumed stress
temperature of 150°C to an application temperature of 55°C.
For more information on Reliability Metrics, please click here.
[Information as of 8-Nov-2009]
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