Radiation Reports & Testing

Home > Space Products > Radiation Reports & Testing

Product(s)	Radiation Report Title
ADC08D1000 ADC08D1520	Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method (pdf) Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter (pdf)
DAC121S101	Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter (pdf)
LM124 LM139 LM193	Low Dose Rate Test Results of National Semiconductor's ELDRS-free Bipolar Amplifier LM124 and Comparators LM139 and LM193 (pdf) For LM139, also see other report below.
LM136	Low Dose Rate Test Results for National Semiconductor's ELDRS-free LM136-2.5 Bipolar Reference (pdf)
LM139	Single Event Transient (SET) Response of National Semiconductor's ELDRS-Free LM139 Quad Comparator (pdf)
LM2941	Low Dose Rate Test Results of National Semiconductor's ELDRS-Free Bipolar Low Dropout (LDO) Regulator, LM2941 at Dose Rates of 1 and 10 mrad(Si)/s (pdf)

For technical questions regarding TI and National Semiconductor products:

TI E2E™ Community (engineer-to-engineer online forums where you can ask questions to your fellow engineers and TI experts, as well as search for similar questions/answers)
TI Product Information Center (TI's email/phone support hotline for your region of the world)

Sign-on to save and manage products in your MyBriefcase, order free samples, create WEBENCH designs in minutes, and set your personal preferences.