Tin Whiskers

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Packaging | Lead-Free Status | Impact to CustomersTin Whiskers
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  • Tin whiskers arise from stresses in the plating and are known to occur on tin plated or tin-alloy plated parts.

  • After plating, an incubation period of several thousand hours may be required before any whiskers begin to grow. The length of this incubation period depends on the lead finish thickness, lead finish grain structure, and on the base metal composition.

  • Tin whiskers are a reliability concern throughout the industry due to the fact that they may bridge the gap between leads causing electrical shorting.

  • As a whisker mitigation measure, National anneals all of its tin plated, leadframe-based packages for 1 hour at 150° C within 24 hours of plating. This is the industry-accepted method for controlling whisker growth.

  • Since thin plating is known to be more susceptible to whisker growth, National maintains a minimum tin plating thickness of 8 microns, with a nominal thickness of 12 microns.

  • National packages are plated with the most advanced plating chemistry in the industry for tin whisker control and have been meeting JEDEC 22A121 specifications since 2010.

 

  National JEDEC
Stress1 / duration TMCL(-55/85° C) / 3000 cycles TMCL(-55/85° C) / 1500 cycles, min.
Stress2 / duration Room conditions/ 10,000 hours 30° C/60%RH / 4000 hours, min.
Stress3 / duration 60° C/93%RH / 7000 hours 60° C/90%RH / 4000 hours, min.
S.S. (screening) 9 terminations 96 terminations
S.S. (detailed insp.) 9 terminations 18 terminations
Inspection Tool SEM required Either SEM or optical

 

  • In terms of lead-free requirements, the current RoHS Directive exempts leadframe packages with pitches less than or equal to 0.65 mm.
  • The following data is collected per the JEDEC requirements given in JESD201:

 

Whisker Test Results per JESD201

Leadframe Material Cu7025 TAMAC 4 Cu194 TAMAC 2
Stress Test Timepoint non- reflowed Precon Condition C Precon Condition D non- reflowed Precon Condition C Precon Condition D non- reflowed Precon Condition C Precon Condition D non- reflowed Precon Condition C Precon Condition D
TMCL
(-40C/ +85C)
500cyc 12.1 μm 16.7 μm 18.9 μm 24.2 μm 19.9 μm < 10 μm 14.4 μm 13.7 µm 11.3 μm 32.5 μm 22.5 μm 11.2 μm
1000cyc 15 um 18.7 μm 19.4 μm 25.2 μm 27.7 μm < 10 μm 22.2 μm 19.1 μm 17.9 μm 35.3 μm 30.2 μm 20.9 μm
1500cyc 19.5 um 23.3 μm 19.9 μm 26.3 μm 27.8 μm 20.8 μm 22.9 μm 21.8 μm 19.3 μm 35.2 μm 31.3 μm 23.4 μm
THST
(55C/85%RH)
1000hr < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm
2000hr 11.4 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm 16.9 μm < 10 μm < 10 μm < 10 μm < 10 μm 19.6 μm
3000hr 31.5 μm 28.9 μm < 10 μm < 10 μm < 10 μm < 10 μm 22.5 μm < 10 μm < 10 μm 15.9 μm < 10 μm 36.7 μm
4000hr 38.7 μm 32.8 μm 26.2 μm s < 10 μm < 10 μm < 10 μm 24.9 μm 29.1 μm < 10 μm 17.1 μm < 10 μm 34 μm
Ambient
(30C/60%RH)
1000hr < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm
2000hr < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm
3000hr < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm
4000hr < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm < 10 μm

 

Leadframe Material

Leadframe Material Packages
Cu194 SOT23, SOT223, DPAK, MSOP, SOIC, SC70, TO252, PSOP, MDIP, LLP
Cu7025 QFP, TSSOP, TO247, TO-PMOD
TAMAC2 TO220 ≤ 9 leads, TS263 ≤ 9 leads
TAMAC4 TO220 ≥ 9 leads

 

Packaging | Lead-Free Status | Impact to CustomersTin Whiskers
Green Compliance | Industry Consortia | Questions & Answers | Literature