System Test Access IEEE 1149 (JTAG) Solutions

NEW Design Tools:

• New - SCANSTA101 Design Guide
  An in-depth look at designing with the SCANSTA101 (4.6MB, pdf)
• New - Quick Reference Guides
  Quick reference for SCAN device registers and operation.
  • SCANSTA101 Quick Reference Guide (pdf)
  • SCANSTA112 Quick Reference Guide (pdf)

Common Uses of JTAG:

• FPGA and Flash Programming
  • Altera
  • Xilinx
• Board Manufacturing Test
• Sub-system level test (Chip BIST)

Select

Selection Table (Catalog view):

• Support Devices
• Interface Devices with JTAG
• Ethernet Devices with JTAG

Featured SCANSTA Products

• - IEEE 1149.1 Analog Voltage Monitor
• - 7-port JTAG Multiplexer
• - 3-port JTAG Multiplexer
• - Embedded JTAG Master

Selection Guides:

• Wireless Infrastructure Design Guide
• All Selection Guides

BIST w/JTAG
The SCAN921023/1224 SerDes chipset features on chip BIST capability accessible via the JTAG port!

/

Design

SCANSTA101 DESIGN GUIDE - An in-depth look at designing with the SCANSTA101 (4.6 MB, pdf)

Quick Reference Cards: Quick reference for SCAN STA device registers and operation.

• SCANSTA101 Quick Reference Guide (pdf)
• SCANSTA112 Quick Reference Guide (pdf)

Featured Application Notes and Technical Documentation:

• AN-1259 - SCANSTA112 Designers Reference

SCAN Application Note Table:

• Support Devices
• Interface JTAG Devices

Frequently Asked Questions

Software & Models

Software Tools:

• NEW - EVF Workbench - Graphical User Interface tool for conversion of SVF files to National Semiconductor's EVF2 embedded file format. Zip file includes readme file, license file, and setup program (1.6MB)
• SCANEASE - SCAN Embedded Applications Software Enabler for the SCANSTA101 – source code and libraries for EVF2 embedded file format delivery. Zip file includes source code, libraries, and examples. (2.5MB)

Models:

• BSDL Files and IBIS Models

Explore

Useful Links

• IEEE Standards Catalog
• IEEE 1149.1 Working Group
• IEEE 1149.4 Mixed-Signal Test Bus Working Group
• IEEE 1149.6 AC Extest Working Group
• IEEE P1500 Standards for Embedded Core Test
• IEEE 1532 Standard for Boundary-Scan-based In System Configuration of Programmable Devices

DfT/BIST Insertion

• LogicVision

ATPG

• ASSET InterTech
• Corelis
• Flynn Systems
• Goepel Electronic
• JTAG Technologies

CPLD/FPGA

• Altera
• Xilinx

Loaner SCAN Backplane EVAL System