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Flip Chip rejection criteria:
Bump coplanarity shall be controlled to +/-15 microns within a die.
BCB window must cover the entire die surface and should not leave any exposed metal on the die surface other than bumping pads. BCB window should leave 96um +/- 4um clearance on the scribestreet for 6 inch wafers and 121um +/- 4um clearance on the scribe street for 8 inch wafers so there is no adverse impact during sawing operation. Measurement is to be taken at the bottom of the BCB slope.
Wrinkling, cracking, pinholes, lifting or other damage to the BCB layers.
Solder composition for solder bumps is acceptable with +/- 2% variation.
External voids and pin holes on the bump are not acceptable.
Missing or partial bumps are not acceptable.
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