Radiation Owners Manual

This manual is designed to assist individuals who work in the field of radiation effects and component hardening, reliability, testing, and evaluation. As a manufacturer of radiation-tolerant products, National Semiconductor is committed to the high-reliability industry and its use of radiation-hardened assured product. To this end, National continues to support and expand the knowledge base through experimentation and investigation of innovative and promising new ideas and by applying the successful ones to new products where appropriate.

Click on the Chapter title or section to download a PDF file of that Chapter.

	Introduction and Overview (80K pdf)
		* Table of Contents * References * Contact Information * Glossary (58K pdf)
	Issues, Environments, Effects (1.23M pdf)
		* Radiation Needs Today * Providing a Unique and Cost-Effective Approach to Your Radiation Needs * Product Migration * Focusing on Military and Space Environments * Radiation Environments * Particle Interaction * Radiation Damage Effects * Radiation Design Issues and Considerations
	Radiation Testing (300K pdf)
		* Test Philosophy * National's Radiation Effects Laboratories * All About National's South Portland, Maine, REL * All About National's Santa Clara, California, REL
	Processing and Flows (53K pdf)
		* Processing Capabilities * Space Options and Test Flows
	Analog Radiation Test Results (582K pdf)
		* Glossary of Analog-Specific Terms * Radiation Results - Analog Summary * Analog Test Results * Analog Final Reports
	Interface Radiation Test Results (1.7M pdf)
		* Glossary of Interface-Specific Terms * Radiation Results - Interface Summary * Interface Products Proposed for RHA Qualifications - Test Results * Interface Final Reports
	Logic Radiation Test Results (3.12M pdf)
		* Glossary of Logic-Specific Terms * Radiation Results - Logic Summary * FACT™ Logic (AC and ACT) * FACT™ Quiet Series Logic (ACQ and ACTQ) * FACT FCT Logic * F100K 300 Series ECL Logic * SCAN System & Board Test Logic (IEEE 1149.1) * Logic Final Reports
	Published Papers (38K pdf)
		* Dose Rate Response of Advanced CMOS Products (164K pdf) * Radiation Design Test Data for Advanced CMOS Product (194K pdf) * Radiation Design Considerations using CMOS Logic (130K pdf) * Total Dose Testing of Advanced CMOS Logic at Low Voltage (109K pdf) * SEU and Latch-up Tolerant Advanced CMOS Technology (186K pdf) * Single Event Upset and Latchup Considerations for CMOS Devices Operated at 3.3V (92K pdf) * Single Event Upset (SEU) Sensitivity Dependence of Linear IC's on Bias Conditions (1.7M pdf) * Ion Induced Charge Collection and SEU Sensitivity of Emitter Coupled Logic (ECL) Devices (3.6M pdf) * Plastic Packaging and Burn-in Effects on Ionizing Dose Response in CMOS Microcircuits (4.94M pdf)
	RHA-Related Documents (33K pdf)
		* Military Performance Specifications * Military Handbooks * Service Documents * Military Test Methods * ASTM Standards * Commercial Test Methods * ESA Test Methods and Guides

For additional information, or to order a hardcopy of this manual, contact your local sales office or email: HiRelOps@nsc.com