SYSTEM TEST ACCESS & SCAN STUFF
 
 
System JTAG Access
Mixed-Signal Test
Analog Corner


STA products provide support for a system or card-level IEEE 1149.1 (JTAG) bus architecture. The JTAG mux is used for managing multiple JTAG chains, while the embedded master simplifies connecting the JTAG bus to a microprocessor bus.

Designing a Multicard Backplane Test Strategy?
Read our applications brief about partitioning 1149.1 scan chains.

Featured STA Products
 
pf SCANSTA476
IEEE 1149.1 Analog Voltage Monitor
pf SCANSTA112
7-port JTAG Multiplexer
pf SCANSTA111
3-port JTAG Multiplexer
pf SCANSTA101
Embedded JTAG Master
   
Product Tables: 

STA Support Devices
STA Interface Devices

 

Selection Guides:

 


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As a leading supplier of LVDS interface solutions, National recognizes the unique challenges that high speed interconnects present to a test engineer. Our innovative JTAG solutions for selected LVDS products uses at-speed BIST to verify the interconnect. We're also the first in the industry to support IEEE 1149.6 for testing AC-coupled interconnects.

Featured LVDS Products
 
pf SCAN15MB200
Dual 1.5Gbps 1:2/2:1 LVDS Mux/Buffer with Pre-emphasis and IEEE 1149.6
pf SCAN90004
1.5Gbps 4-channel LVDS Buffer/Repeater with Pre-emphasis and IEEE 1149.6
pf SCAN90CP02
Worlds First 1.5Gbps 2x2 LVDS Crosspoint switch with Pre-emphasis and IEEE 1149.6
pf SCAN921821
Dual 15 - 66 MHz 18-bit Serializer with Pre-emphasis, JTAG, and 12 kV ESD (Bus Pins)
pf SCAN921025H/1226H
High Temperature 20-80MHz 10:1/1:10 LVDS SerDes
pf SCAN928028
Eight 10:1 66MHz LVDS Serializers
   

 


IEEE 1149.1 easily handles digital test, but what about Analog test?

sta476diagram.jpg
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