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| EOS/ESD INFORMATION |
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| Ruptured Package: Sources | ||
| Humans | Description | Investigate |
| Mis-orientation of IC | Check for mis-insertion | |
| Inadvertent application of voltage | Look for voltage surges and/or sustained high current sources | |
| Machine | Mis-orientation of IC | Check for mis-insertion |
| Inadvertent application of voltage | Look for unregulated/broken power supplies. | |
| Environment | ||
| Lightning strike, power supply surge/transient | Exposures to lightening and/or power supply surge | |
| Latch-up condition | Application and test procedures against latch-up conditions | |
| High ambient temperature | Sustained high ambient temperature exceeding operating range. | |
