Korean Chinese Traditional Chinese Simplified Japanese


EOS/ESD INFORMATION

 

EOS/ESD Information


Return to Cause and Effect menu   Go to the Effects section Currently in the Causes section Go to the Sources section Go to the Methods of Investigation section

 Ruptured Package: Causes
Voltage Spike  Description  Investigate
Diagram or refer to CDM or CCM waveform or other waveforms HBM, MM, EURONORM, CDM
Junction damage may have occurred first. Refer to Junction damage section
Metallization burn-out Voltage >10v and  Pulse width >1µsec but <10sec