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| EOS/ESD INFORMATION |
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| Melted Bond Wire: Sources | ||
| Humans | Description | Investigate |
| Mis-insertion of IC / device | Check for mis-insertion | |
| Wrong test program | Check line test history. | |
| Machine | System test over-current event | Check over-current limiters on system testers |
| Power supplies unregulated | Power supply regulation | |
| Environment | ||
| Lightening strike, power supply surge / transient | Exposure to lightning and/or power supply surge | |
| Latch-up condition | Application and test procedures against latch-up conditions. | |
