Radiation Reports & Testing from National Semiconductor Home->Space Products

Radiation Reports & Testing

Product(s)	Radiation Report Title
ADC08D1000 ADC08D1520	Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method (pdf) Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter (pdf)
DAC121S101	Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter (pdf)
LM124 LM139 LM193	Low Dose Rate Test Results of National Semiconductor’s ELDRS-free Bipolar Amplifier LM124 and Comparators LM139 and LM193 (pdf) For LM139, also see other report below.
LM136	Low Dose Rate Test Results for National Semiconductor’s ELDRS-free LM136-2.5 Bipolar Reference (pdf)
LM139	Single Event Transient (SET) Response of National Semiconductor’s ELDRS-Free LM139 Quad Comparator (pdf)
LM2941	Low Dose Rate Test Results of National Semiconductor’s ELDRS-Free Bipolar Low Dropout (LDO) Regulator, LM2941 at Dose Rates of 1 and 10 mrad(Si)/s (pdf)

For more products, see National's complete list of radiation-tolerant products.

WHAT'S NEW

Space Products

ADC10D1000QML
Low Power, 10-Bit, Dual 1.0 GSPS or Single 2.0 GSPS A/D Converter from the PowerWise® Family
ADC14155QML
14-Bit, 155 MSPS, 1.1 GHz Bandwidth A/D Converter
ADC128S102QML
8-Channel, 50 kSPS to 1 MSPS, 12-Bit A/D Converter
DAC121S101QML
12-Bit Micro Power Digital-to-Analog Converter with Rail-to-Rail Output
LMP2012QML
Dual, High Precision, Rail-to-Rail Output Operational Amplifier
ADC08D1520QML
Low Power, 8-Bit, Dual 1.5 GSPS or Single 3.0 GSPS A/D Converter
Space Newsletter (pdf 297KB)

ELDRS Qualified Products

MY BRIEFCASE

Remove all from My Briefcase

Click any "Briefcase" icon to add an item