Test Optimization Home->Military /Aerospace

National Semiconductor's Test Optimization
# Operation/Test Optimized Notes Starting PCN# GIDEP#
1 Constant Acceleration, Ceramic Pkg. 1 D/C 9534 MA95018 AH6-C-95-14
2 Level S Operating Life Test Option   Feb-96 MA96005 AH6-C-96-06
3 AFT Test Elimination - FAST & TTL  1 May-96 MA96014 AH6-C-96-09
4 -55 C Test Elimination - FACT Product  1 Jun-96 MA96016 AH6-C-96-09
5 Constant Acceleration, Metal cans 1 Jun-96 MA96022 AH6-C-97-01
6 Rebound Test Elimination - Radhard Product   Sep-96 MA96029 AH6-C-97-05
7 MLS (Space Flow, non QML) FACT -55 Test Elimination 2 May-97 MA97013 AH6-C-97-12
8 LFAST Level-S Metal Step Coverage   Jun-97 MA97021 AH6-C-97-14
9 Standardized 883/JAN B FACT AC/DC Testing 1 Oct-97 MA97028 AH6-C-97-19
10 S-Level Step Coverage Sampling Plan - Logic 3 Aug-98 MA98017 AH6-C-98-11
11 FACT, S-Level Static Burn-In Reduction    Aug-98 MA98019 AH6-C-98-13
12 Standardized 883/JAN B FAST AC/DC Testing 1 Sep-98 MA98021 AH6-C-98-14
13 FAST, B-Level Burn-In Reduction 1 Dec-98 MA98026 AH6-C-99-03
14 Package Consolidation for QCI Group D   Dec-98 MA98027 AH6-C-99-04
15 Thermal Stability Testing - Level S & V   Oct-99 MA99025 AH6-C-00-02
16 LS244 Temperature Testing Reduction  1 Jan-01 MA2001-03 AH6-C-01-13
17 FACT 2.0u Burn-In Reduction 1 Jul-00 MA2000-08 AH6-C-00-10
18 LM129 TEMPCO Testing Reduction
(Device went EOL 9/2/2003)		 1 Dec-00 MA2001-01 AH6-C-01-11
19 DS26LS31 Burn-In Reduction  1 Jul-00 MA2000-09 AH6-C-00-11
20 LM124 Burn-In Reduction, 883/JAN B 1 Aug-00 MA2000-10 AH6-C-00-12
21 LM139 Burn-In Reduction 1 Dec-00 MA2001-02 AH6-C-01-12
24 LS Family Burn-In Reduction 1 Oct-01 MA2001-08 AH6-C-02-01
25 JL124 & JL139 AC Elimination 1 Mar-02 MA2002-05 AH6-C-02-10
27 FACT 1.5u Burn-In Elimination 1 5/14/02 MA2002-08 AH6-C-02-13
28 Production Grade Die (PGD) Qualification for LM124A/883 Series 1 10/7/02 MA2002-19 AH6-C-03-01
29 LM111 Burn-In Elimination, 883/JAN B 1 6/28/02 MA2002-13 AH6-C-02-17
30 LM158 Burn-In Elimination, 883/JAN B 1 11/4/02 MA2002-20 AH6-C-03-02
31 DS96F173/175 Burn-In Elimination 1 8/2/02 MA2002-15 AH6-C-02-19
32 JL/LM148 Burn-In Elimination 1 11/4/02 MA2002-21 AH6-C-03-03
33 LM139 Quad Comparator Test Flow Change (PGD Flow) 1 1/15/03 MA2003-01 AH6-C-03-05
34 LM741 Burn-In Elimination 1 6/2/03 MA2003-06 AH6-C-03-05
35 LM723 Burn-In Elimination 1 11/10/03 MA2003-12 AH6-C-04-02
36 PGD Qualification for LM136H/AH Series 1 10/10/05 N/A N/A
37 PGD Qualification for LM148 1 Date Code 0609 N/A N/A
38 DS26LS31 Burn-In Elimination 1 Date Code 0550 MA2005-21 AH6-C-06-05
39 TBD        

 

Notes:

  1. S Level Products are not included
  2. Applies to Standard MLS (Space flow, non QML) Only
  3. Review PCN for Product Exceptions

 
WHAT'S NEW
Milaero Products
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    ADC08D1520WGFQV Dual Channel, 8-Bit, 1.5 GSPS Analog-to-Digital Converter with Latch-up Levels of 120 MeV and 300 krad (Si)
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    Highest Performance, Lowest Power Dual 10-bit 1 GSPS Space-Qualified ADC
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    1.1 GHz Bandwidth ADC Enables High IF-Sampling for Space-Based Narrowband Communications Applications
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ELDRS Qualified Products


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