SCANSTA476 Evaluation Kit - SCANSTA476 IEEE 1149.1 Analog Voltage Monitor, Analog Test Probes, ADC, JTAG
SCANSTA476 Evaluation Kit Overview - IEEE 1149.1 Analog Voltage Monitor
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The IEEE 1149.1 (JTAG) standard has been used on electronic boards and systems for many years for digital and structural test access. The standard continues to expand as more uses for the test bus emerge, such as FPGA configuration, Emulation, and Flash programming.
National’s SCANSTA476 IEEE 1149.1 Analog Voltage Monitor device extends the IEEE 1149.1 bus access into the analog realm by providing a simple method of measuring system voltages. The SCANSTA476 is a low power, mixed-signal test and measurement device which uses the IEEE 1149.1 (JTAG) interface to access up to 8 analog/mixed-signal input channels. Each of the eight multiplexed input channels is selectable for sampling via an instruction loaded to the JTAG Test Access Port (TAP). The analog value of the selected input is converted to a 12-bit digital value and stored in a JTAG TAP register. The resulting measurement may be scanned out of the register thru the JTAG TAP.
This evaluation kit demonstrates a simple implementation of the SCANSTA476 device, it allows the user to exercise the device operation and make simple measurements.
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Evaluation Kit Contents
Each Kit consists of the following components:
The documentation provides an overview of the card and it's features and capabilities. Simple example lines of SVF code are shown for exercising the SCANSTA476.
Note that software and hardware tools to convert the SVF, or for vector generation and delivery, are available from our third party ATPG partners.
For your convenience, the following direct links may be used to obtain vendor-specific support files for the SCANSTA476 evaluation kit:
For more details about the SCANSTA476 IEEE 1149.1 Analog Voltage Monitor, refer to the product folder.
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