System Test Access IEEE 1149 (JTAG) Solutions

System JTAG Access

SCANSTA products provide support for a system or card-level IEEE 1149.1 (JTAG) bus architecture. The JTAG mux is used for multiplexing and managing multiple JTAG chains, while the embedded master simplifies connecting the JTAG bus to a microprocessor bus.

Designing a Multicard Backplane Test Strategy?
Read our applications brief about partitioning 1149.1 scan chains.

Featured SCANSTA Products

• SCANSTA476 - IEEE 1149.1 Analog Voltage Monitor
• SCANSTA112 - 7-port JTAG Multiplexer
• SCANSTA111 - 3-port JTAG Multiplexer
• SCANSTA101 - Embedded JTAG Master

Selection Guides:

• NEW! Wireless Infrastructure Design Guide and other selection guides

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SCAN White Papers & Brochures

• Preliminary Results of Passive Component Measurement Methods Using an IEEE 1149.4 Compliant Device from the Board Test Workshop
  • White Paper (114K pdf)
  • Presentation Slides (175K pdf)
• Fault Insertion using IEEE1149.1
  Silicon implementation and tool support
  • White Paper (250K pdf)
• Applications Brief 121 - Partition IEEE 1149.1 SCAN Chains for Manageability! (69K pdf)
• Using At-Speed BIST To Test LVDS Serializer/Deserializer Function (665K pdf)

SCAN Application Notes

• AN-1340 Simplified Programming of Xilinx FPGA’s using a SCANSTA111/112 Scan Chain Mux
• AN-1327 Simplified Programming of Altera FPGA’s using a SCANSTA111/112 Scan Chain Mux
• AN-1312 STA111/STA112 Timing
• AN-1313 SCAN90CP02 DfT Features
• AN-1259 SCANSTA112 Designers Reference
• Satellite Hierarchical System Test Using IEEE 1149.1[1]-Based COTS Test Tools: A Case History with Results and Lessons
• AN-891 Non-Contact Test Access for Surface Mount Technology
• AN-890 P1149.1A Extensions to IEEE-Std-1149.1-1990

Analog Corner

IEEE 1149.1 easily handles digital test, but what about Analog test?

• SCANSTA476 IEEE 1149.1 Analog Voltage Monitor

Other SCAN Information

• BSDL Files
• IBIS Models
• SCANSTA Evaluation Kits
• Frequently Asked Questions
• SCANEASE Software for the SCANSTA101

Useful Links

• IEEE Standards Catalog
• IEEE 1149.1 Working Group
• IEEE 1149.4 Mixed-Signal Test Bus Working Group
• IEEE 1149.6 AC Extest Working Group
• IEEE P1500 Standards for Embedded Core Test
• IEEE 1532 Standard for Boundary-Scan-based In System Configuration of Programmable Devices

DfT/BIST Insertion

• LogicVision

ATPG

• ASSET InterTech
• Corelis
• Goepel Electronic
• JTAG Technologies

CPLD/FPGA

• Altera
• Xilinx