Overview: Designers for data acquisition systems are always facing new challenges from complex noise sources inside and outside of the systems. A lot of time and efforts have to be spent on removing the noise captured from various components of the data acquisition process: Operational Amplifiers, Analog to Digital Converters, Power lines and Digital Communication Interface and so on. In this webinar, we will share the techniques and solutions with design engineers on how to improve noise rejection, especially the EMI from the working environment of devices, e.g. Cell phone Signal, UHF, VHF¡etc. We will also discuss from concept to real application our EMI rejection solution and how this solution simplifies data acquisition system designs.
Length: 31 minutes
Published Date: September 2008
Topics covered in this online seminar include:
- Effect of EMI on Data Acquisition Systems
- Effect of EMI on the overall system performance
- Where does EMI enter the system
- Overall system sensitivity for EMI
- Improved EMI robustness through EMI hardened op amps
- Effect of EMI on op amp performance
- EMIRR parameter
- Measuring EMIRR
- Application examples
- EMI hardened products
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Presentation (pdf)
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 Presenter: Don Foong, Staff Field Application Engineer
Don has over 20 years of experience in the electronics industry holding various positions such as components procurement and field application. He joined National from Westech Electronics where served as a Senior Field application engineer for five years. Don graduated from Nanyang Technological University with a degree in Electrical and Electronics Engineering.
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 Contributor: Gerrit De Wagt, Applications Engineering Manager
Gerrit has over 10 Years of experience in the electronics industry. He works within the Precision Signal Path Division at National Semiconductor based in The Netherlands since 2001. The products he worked on include: RF Detectors, Clock Buffers, Microphone pre-Amplifiers, and EMI hardened OpAmps. Prior to National Semiconductor, Gerrit worked as a Design Engineer for a barcode scanning company. He received his Bachelor degree in Electrical Engineering in 1998 from the NHL, Leeuwarden, The Netherlands.
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